Jeremy Bonsall
at Aerospace Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 March 2019 Paper
Yongkun Sin, Dmitry Veksler, Jeremy Bonsall, Scott Sitzman, Miles Brodie, Zachary Lingley, Brendan Foran
Proceedings Volume 10918, 109181B (2019) https://doi.org/10.1117/12.2507016
KEYWORDS: Field effect transistors, Gallium nitride, Transmission electron microscopy, Reliability, Strain analysis, Radiation effects, Amplifiers

Proceedings Article | 16 February 2017 Paper
Yongkun Sin, Jeremy Bonsall, Zachary Lingley, Miles Brodie, Maribeth Mason
Proceedings Volume 10104, 101041B (2017) https://doi.org/10.1117/12.2250250
KEYWORDS: Field effect transistors, Gallium nitride, Transmission electron microscopy, Reliability, Radiation effects, Transistors, Solid state electronics, Amplifiers, Silicon carbide, Diodes

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