Joy Tan
at RMIT Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 July 2005 Paper
J. Tan, K. Kalantar-zadeh, W. Wlodarski, S. Bhargava, D. Akolekar, A. Holland, G. Rosengarten
Proceedings Volume 5836, (2005) https://doi.org/10.1117/12.609819
KEYWORDS: Bismuth, Thin films, Tellurium, Thermoelectric materials, Sputter deposition, Thin film deposition, Scanning electron microscopy, Temperature metrology, X-ray diffraction, Metals

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