We present a near-infrared (NIR) imager based on high-performance organic photodiode in terms of dark current, specific detectivity and response time. A carefully designed interfacial layer is introduced in the thin-film organic photodiode stack to reduce trap assisted carrier emission leading to sub-nA/cm2 dark current and external quantum efficiency above 50% in the NIR range. The developed imager chip benefits from this improved dark current-voltage characteristic (high light signal to dark noise ratio) and enables high-resolution, monolithic NIR image sensors.
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