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Justin J. Henrie
at Brigham Young Univ
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Publications (1)
Proceedings Article | 18 August 2005 Paper
Thin film thickness determination using reflected spectrum sampling
Proceedings Volume 5878, 58780I (2005) https://doi.org/10.1117/12.613197
KEYWORDS: Light emitting diodes, Reflectivity, Reflectometry, Light sources, Thin films, Reflectance spectroscopy, Error analysis, Continuous wave operation, Semiconducting wafers, Spectroscopes
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