Dr. Kensuke Murashima
at Kaneka Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 December 2020 Poster
Proceedings Volume 11444, 114447Z (2020) https://doi.org/10.1117/12.2563184
KEYWORDS: Thermography, X-rays, X-ray optics, X-ray imaging, Polarimetry, Aluminum, Epoxies, Tolerancing, Environmental sensing, Distortion

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top