Dr. Kerim T. Arat
Guest Researcher
SPIE Involvement:
Author
Area of Expertise:
SEM , EBL , Monte Carlo , Nanofabrication , Defect Metrology , 3D Metrology
Publications (5)

Proceedings Article | 13 June 2022 Presentation
András Vladár, Kerim Arat, Robert Polster
Proceedings Volume PC12053, PC1205309 (2022) https://doi.org/10.1117/12.2614335
KEYWORDS: Scanning electron microscopy, Electron beams, Optical testing

SPIE Journal Paper | 5 December 2019
Kerim T. Arat, Thomas Klimpel, Cornelis Hagen
JM3, Vol. 18, Issue 04, 044003, (December 2019) https://doi.org/10.1117/12.10.1117/1.JMM.18.4.044003
KEYWORDS: Monte Carlo methods, Scattering, Scanning electron microscopy, Dielectrics, Electron microscopes, Silicon, Statistical modeling, Copper, Clouds, Oxides

Proceedings Article | 13 March 2018 Presentation + Paper
K. Arat, T. Klimpel, C. Hagen
Proceedings Volume 10585, 1058518 (2018) https://doi.org/10.1117/12.2297478
KEYWORDS: Scattering, Monte Carlo methods, Dielectrics, Scanning electron microscopy, Modeling, Computer simulations, Dielectric breakdown

Proceedings Article | 28 September 2017 Paper
Jens Bolten, Kerim Arat, Nezih Ünal, Caroline Porschatis, Thorsten Wahlbrink, Max Lemme
Proceedings Volume 10446, 104460G (2017) https://doi.org/10.1117/12.2279564
KEYWORDS: Scanning electron microscopy, Inspection, Image analysis, Image processing, Metrology, Nanofabrication, Nanostructures, Basic research, Analytical research

Proceedings Article | 21 April 2016 Paper
K. T. Arat, J. Bolten, T. Klimpel, N. Unal
Proceedings Volume 9778, 97780C (2016) https://doi.org/10.1117/12.2219182
KEYWORDS: Optical simulations, Resolution enhancement technologies, Scanning electron microscopy, Monte Carlo methods, Metrology, Inspection, 3D metrology, 3D modeling, Modeling, Semiconductors, Electrons, Magnesium, Silicon, Sensors

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