Dr. Lei Huang Profile

Dr. Lei Huang

Physicist at Brookhaven National Lab

SPIE Involvement:

Conference Program Committee | Author

Publications (32)

Proceedings Article | 8 October 2024 Presentation + Paper

Post-production correction of lamellar x-ray gratings by ion beam figuring

D. Voronov, T. Wang, S. Park, L. Huang, E. Gullikson, F. Salmassi, S. Ch. Samudrala, H. Padmore, M. Idir

Proceedings Volume 13150, 131500B (2024) https://doi.org/10.1117/12.3030116

KEYWORDS: Ion beam finishing, Diffraction gratings, Optical surfaces, Blazed gratings, Diffraction, Gold, Coating, Ion beams, X-rays

Read Abstract +

Proceedings Article | 30 September 2024 Presentation + Paper

Key aspects of sub-nanometer deterministic ion beam figuring for synchrotron hard x-ray mirror fabrication

Tianyi Wang, Lei Huang, Yi Zhu, Nathalie Bouet, Corey Austin, Mourad Idir

Proceedings Volume 13134, 131340K (2024) https://doi.org/10.1117/12.3027640

KEYWORDS: Mirrors, Ion beam finishing, Mathematical optimization, Ion beams, X-rays, Hard x-rays, Fabrication, Metrology, Synchrotrons, Optical surfaces

Read Abstract +

Proceedings Article | 18 June 2024 Presentation

Synchrotron mirror inspection and fabrication using stitching interferometry and ion beam figuring at NSLS-II

Lei Huang, Tianyi Wang, Corey Austin, Mourad Idir

Proceedings Volume 12997, 129970K (2024) https://doi.org/10.1117/12.3022745

KEYWORDS: Stitching interferometry, Synchrotrons, Mirror surfaces, Mirrors, Fabrication, Ion beams, Optical surfaces, Inspection, Wavefronts, Optics manufacturing

Read Abstract +

Proceedings Article | 30 November 2023 Presentation

Computer controlled optical surfacing powered by a novel position-velocity-time motion scheduler

Tianyi Wang, Lei Huang, Corey Austin, Mourad Idir

Proceedings Volume PC12778, PC1277806 (2023) https://doi.org/10.1117/12.2691700

KEYWORDS: Discontinuities, Convolution, Optical surfaces, Interpolation, Raster graphics, Motion controllers

Read Abstract +

Proceedings Article | 6 October 2023 Presentation

Investigation of x-ray Hartmann wavefront sensing: from simulation to the initial experiment test

Lei Huang, Tianyi Wang, Oleg Chubar, Guillaume Dovillaire, An He, Max Rakitin, Yang Yang, Andrew Kiss, Mourad Idir

Proceedings Volume PC12697, PC1269705 (2023) https://doi.org/10.1117/12.2675754

KEYWORDS: X-rays, Wavefront sensors, Wavefronts, Diagnostics, X-ray diffraction, Design and modelling, X-ray detectors, Optical simulations, Imperfections, Computer simulations

Read Abstract +

Proceedings Article | 5 October 2023 Presentation + Paper

A machine-learning-based approach for angular alignment of 2D multilayer Laue lenses for high-resolution hard x-ray microscopy

Wei Xu, Weihe Xu, Nathalie Bouet, Juan Zhou, Hanfei Yan, Xiaojing Huang, Lei Huang, Ming Lu, Maxim Zalalutdinov, Yong Chu, Evgeny Nazaretski

Proceedings Volume 12698, 1269803 (2023) https://doi.org/10.1117/12.2673688

KEYWORDS: Optical alignment, Optical surfaces, Interferometers, X-ray optics, Machine learning, Hard x-rays, Lenses, X-rays, X-ray microscopy, Equipment

Read Abstract +

Proceedings Article | 3 October 2023 Paper

Modeling and characterizing transmission windows for in-situ interferometric measurements of cryogenically cooled mirrors

Grant Cutler, Corey Austin, Lei Huang, Lance Lee, Daniele Cocco, Mourad Idir

Proceedings Volume 12695, 1269508 (2023) https://doi.org/10.1117/12.2682619

KEYWORDS: Mirrors, Windows, Vacuum chambers, Interferometry, Metrology, Refraction, Silica, Temperature metrology, Zemax, Modeling

Read Abstract +

Proceedings Article | 8 September 2021 Presentation + Paper

Recent advances in nano-scale spatial resolution x-ray microscopy instrumentation at NSLS-II

E. Nazaretski, Wei Xu, H. Yan, X. Huang, Weihe Xu, N. Bouet, J. Zhou, D. S. Coburn, L. Huang, Y. Yang, A. Kiss, M. Idir, Y. S. Chu

Proceedings Volume 11839, 1183903 (2021) https://doi.org/10.1117/12.2595045

KEYWORDS: Spatial resolution, X-ray microscopy, Microscopy, Microscopes, X-rays, Imaging systems, Hard x-rays, Synchrotrons, Silicon, Lenses

Read Abstract +

Proceedings Article | 7 June 2021 Paper

Testing surface form of precision optics by a point diffraction interferometer with two beams

Nikolay Voznesenskiy, Mariia Voznesenskaia, Lei Huang, Mourad Idir

Proceedings Volume 11853, 1185308 (2021) https://doi.org/10.1117/12.2595181

Read Abstract +

Proceedings Article | 15 November 2019 Presentation + Paper

Study on the performances of dwell time algorithms in ion beam figuring

Tianyi Wang, Lei Huang, Kashmira Tayabaly, Mourad Idir

Proceedings Volume 11175, 111750M (2019) https://doi.org/10.1117/12.2536869

KEYWORDS: Ion beam finishing, Ion beams, Deconvolution, Fourier transforms, Metrology, Convolution, Synchrotrons

Read Abstract +

Proceedings Article | 9 September 2019 Presentation + Paper

Collaborative development of diffraction-limited beamline optical systems at US DOE light sources

Kenneth Goldberg, Antoine Wojdyla, Diane Bryant, Weilun Chao, Daniele Cocco, Corey Hardin, Daniel Morton, May Ling Ng, Lance Lee, Lahsen Assoufid, Walan Grizolli, Xianbo Shi, Steve Kearney, Michael Wojcik, Yuri Shvyd'ko, Deming Shu, Mourad Idir, Lei Huang

Proceedings Volume 11109, 111090C (2019) https://doi.org/10.1117/12.2530817

KEYWORDS: Mirrors, Wavefronts, Wavefront sensors, Sensors, X-rays, Optical alignment, Monochromatic aberrations, Hard x-rays, Diffraction, Crystals, Adaptive optics

Read Abstract +

Proceedings Article | 9 September 2019 Presentation

Stitching interferometry for synchrotron mirror metrology at NSLS-II (Conference Presentation)

Lei Huang, Tianyi Wang, Kashmira Tayabaly, Mourad Idir

Proceedings Volume 11109, 111090R (2019) https://doi.org/10.1117/12.2526502

KEYWORDS: Mirrors, Metrology, Synchrotrons, Stitching interferometry, X-rays, Free electron lasers, Inspection, Interferometry, Synchrotron radiation, Polishing

Read Abstract +

Proceedings Article | 9 September 2019 Presentation + Paper

One-dimensional ion-beam figuring solution from Brookhaven National Laboratory

Tianyi Wang, Lei Huang, Matthew Vescovi, Dennis Kuhne, Kashmira Tayabaly, Nathalie Bouet, Mourad Idir

Proceedings Volume 11109, 1110909 (2019) https://doi.org/10.1117/12.2526074

KEYWORDS: Mirrors, Ion beams, Metrology, Calibration, Error analysis, Deconvolution, Ion beam finishing, Synchrotrons

Read Abstract +

Proceedings Article | 9 September 2019 Paper

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

E. Nazaretski, W. Xu, H. Yan, X. Huang, Wei Xu, N. Bouet, J. Zhou, D. S. Coburn, W. -K. Lee, M. Ge, L. Huang, M. Idir, Y. S. Chu

Proceedings Volume 11112, 111120M (2019) https://doi.org/10.1117/12.2528166

KEYWORDS: X-rays, X-ray microscopy, Microscopy, Spatial resolution, Imaging systems, X-ray optics, Microelectromechanical systems

Read Abstract +

Proceedings Article | 18 September 2018 Open Access

Real-time feedback for x-ray adaptive optics with an interferometric absolute distance sensor array

Ernesto Abruña, Vivek Badami, Lei Huang, Mourad Idir

Proceedings Volume 10761, 107610H (2018) https://doi.org/10.1117/12.2323698

KEYWORDS: Sensors, Metrology, X-ray optics, Adaptive optics, Interferometry, In situ metrology, Position sensors, Synchrotron radiation imaging, Deformable mirrors, Fiber optics sensors

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 23 August 2017 Paper

Alignment of KB mirrors with at-wavelength metrology tool simulated using SRW

Mourad Idir, Maksim Rakitin, Bo Gao, Junpeng Xue, Lei Huang, Oleg Chubar

Proceedings Volume 10388, 103880Z (2017) https://doi.org/10.1117/12.2274264

KEYWORDS: Metrology, Mirrors, Optical alignment, Wavefront sensors, Device simulation, Synchrotrons, X-rays, Synchrotron radiation, Wavefront aberrations, In situ metrology

Read Abstract +

Proceedings Article | 13 June 2017 Paper

Three-dimensional shape measurement with modal phase measuring deflectometry

Lei Huang, Junpeng Xue, Bo Gao, Mourad Idir

Proceedings Volume 10449, 1044909 (2017) https://doi.org/10.1117/12.2269017

KEYWORDS: Deflectometry, 3D metrology, Phase measurement, Mathematical modeling, Optical metrology, Ray tracing, 3D modeling, Nonlinear optics, Cameras, 3D acquisition

Read Abstract +

Proceedings Article | 25 October 2016 Paper

New scheme to control x-ray deformable mirrors

Lei Huang, Mourad Idir

Proceedings Volume 9687, 968704 (2016) https://doi.org/10.1117/12.2241522

KEYWORDS: Deformable mirrors, X-rays, Mirrors, Inspection, Metrology, Actuators, Silicon, X-ray optics, Adaptive optics, Feedback loops

Read Abstract +

Proceedings Article | 25 October 2016 Paper

X-ray optics R&D at NSLSII: focus on optical metrology development

Mourad Idir, Lei Huang, Konstantine Kaznatcheev, Shinan Qian, Guillaume Dovillaire, Rafael Mayer

Proceedings Volume 9687, 96870G (2016) https://doi.org/10.1117/12.2248223

KEYWORDS: X-ray optics, Optical metrology, Mirrors, Metrology, Polishing, Ion beams, Optical components, Surface finishing, Optics manufacturing, Spatial frequencies

Read Abstract +

Proceedings Article | 8 September 2016 Presentation + Paper

Control x-ray deformable mirrors with few measurements

Lei Huang, Junpeng Xue, Mourad Idir

Proceedings Volume 9965, 99650H (2016) https://doi.org/10.1117/12.2237808

KEYWORDS: X-rays, Actuators, Deformable mirrors, Metrology, Standards development, Mirrors, Mirrors, Inspection, Time metrology, X-ray optics, Adaptive optics

Read Abstract +

SPIE Journal Paper | 5 August 2015

High-accuracy aspheric x-ray mirror metrology using Software Configurable Optical Test System/deflectometry

Run Huang, Peng Su, James Burge, Lei Huang, Mourad Idir

OE, Vol. 54, Issue 08, 084103, (August 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.8.084103

KEYWORDS: Mirrors, Calibration, Cameras, X-ray optics, X-rays, Optical testing, Metrology, Distortion, Aspheric lenses, Monochromatic aberrations

Read Abstract +

Proceedings Article | 17 July 2015 Paper

Quantitative phase measurement for wafer-level optics

Weijuan Qu, Yongfu Wen, Zhaomin Wang, Fang Yang, Lei Huang, Chao Zuo

Proceedings Volume 9524, 95242J (2015) https://doi.org/10.1117/12.2189703

KEYWORDS: Digital holography, Phase measurement, Holograms, Wafer-level optics, Digital recording, Phase imaging, Wavefronts, Microscopes, Cameras, Inspection

Read Abstract +

Proceedings Article | 12 March 2015 Paper

Phase retrieval in arbitrarily shaped aperture with the transport-of-intensity equation

Lei Huang, Chao Zuo, Mourad Idir, Weijuan Qu, Anand Asundi

Proceedings Volume 9401, 94010B (2015) https://doi.org/10.1117/12.2087754

KEYWORDS: Phase retrieval, Charge-coupled devices, Transform theory, Fourier transforms, Phase compensation, Optical alignment, Aerospace engineering, Wavefront sensors, Image acquisition, Microscopes

Read Abstract +

Proceedings Article | 22 June 2013 Paper

Investigation of surface and subsurface profile, techniques of measurement, and replication of the Chinese Magic Mirror

Eden Kang Min, Sook May Watt, Parthasarathy Sreemathy, Lei Huang, Anand Asundi

Proceedings Volume 8769, 876930 (2013) https://doi.org/10.1117/12.2021112

KEYWORDS: Mirrors, Interferometers, Microscopes, Fringe analysis, Aluminum, Reflectivity, Reflectometry, Surface finishing, Manufacturing, Scanning electron microscopy

Read Abstract +

Proceedings Article | 22 June 2013 Paper

Specular 3D shape measurement with a compact fringe reflection system

Lei Huang, Jun Xian Wong, Anand Asundi

Proceedings Volume 8769, 87691K (2013) https://doi.org/10.1117/12.2018927

KEYWORDS: Reflection, 3D metrology, Cameras, Calibration, Fringe analysis, Beam splitters, Computer aided design, Imaging systems, LCDs, Phase shifting

Read Abstract +

Proceedings Article | 22 June 2013 Paper

4D metrology of flapping-wing micro air vehicle based on fringe projection

Qican Zhang, Lei Huang, Yao-Wei Chin, Lau-Gih Keong, Anand Asundi

Proceedings Volume 8769, 87692Y (2013) https://doi.org/10.1117/12.2021034

KEYWORDS: Micro unmanned aerial vehicles, Fringe analysis, 3D metrology, Cameras, Metrology, Aerodynamics, 3D image processing, High speed cameras, Signal processing, Fourier transforms

Read Abstract +

Proceedings Article | 6 December 2012 Paper

Phase shift reflectometry for sub-surface defect detection

Anand Asundi, Huang Lei, Teoh Kang Min Eden, Parthasarathy Sreemathy, Watt Sook May

Proceedings Volume 8563, 85630G (2012) https://doi.org/10.1117/12.1000032

KEYWORDS: Mirrors, Phase shifts, Reflectometry, Interferometers, Defect detection, Microscopes, Confocal microscopy, Scanning electron microscopy, Optical components, Surface finishing

Read Abstract +

Proceedings Article | 28 April 2012 Paper

Improvement of least squares integration method with iterative compensation for shape reconstruction from gradient

Lei Huang, Anand Asundi

Proceedings Volume 8430, 84300S (2012) https://doi.org/10.1117/12.921402

KEYWORDS: Matrices, Data integration, 3D metrology, Wavefronts, Data modeling, Aerospace engineering, Laser optics, Reflection, Error analysis, Metrology

Read Abstract +

Proceedings Article | 30 August 2011 Paper

Study on three-dimensional shape measurement of partially diffuse and specular reflective surfaces with fringe projection technique and fringe reflection technique

Lei Huang, Anand Asundi

Proceedings Volume 8133, 813304 (2011) https://doi.org/10.1117/12.891876

KEYWORDS: 3D metrology, Reflection, Calibration, Reflectivity, Projection systems, Cameras, Fringe analysis, Reflectometry, LCDs, 3D acquisition

Read Abstract +

Proceedings Article | 17 November 2010 Paper

Comparison of two-dimensional phase retrieval methods from single interference fringe pattern

Huang Lei, Kemao Qian, Anand Asundi

Proceedings Volume 7851, 785107 (2010) https://doi.org/10.1117/12.875071

KEYWORDS: Fringe analysis, Fourier transforms, Phase retrieval, Speckle, Wavelet transforms, Reflectivity, Transform theory, Aerospace engineering, Phase measurement, 3D metrology

Read Abstract +

Proceedings Article | 15 April 2010 Paper

Compact fringe projection profilometer

Lei Huang, Sian Shing Chng, Cheok Peng Lee, Patrick S. K. Chua, A. Asundi

Proceedings Volume 7522, 752256 (2010) https://doi.org/10.1117/12.851436

KEYWORDS: 3D metrology, Profilometers, Calibration, 3D acquisition, Phase shifts, Fringe analysis, Sensors, Projection systems, Profiling, Phase shifting

Read Abstract +

Proceedings Article | 15 April 2010 Paper

Least-squares phase-height mapping for fringe projection profilometry considering camera lens distortion

Lei Huang, Patrick S. K. Chua, A. Asundi

Proceedings Volume 7522, 75220I (2010) https://doi.org/10.1117/12.851431

KEYWORDS: Calibration, Distortion, Cameras, Fringe analysis, Projection systems, Imaging systems, 3D metrology, Error analysis, Control systems, Device simulation

Read Abstract +

Showing 5 of 32 publications

Conference Committee Involvement (2)

Advances in Metrology for X-Ray and EUV Optics XI

3 August 2025 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics X

23 August 2023 | San Diego, California, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years