Microelectromechanical systems (MEMS) are electronic devices with movable micromechanical structures, which possess morphology and deformation in scales difficult to observe by traditional microscopic methods. In this paper, the surface morphology and deformation value of MEMS with complex structure was recovered by digital holographic technology, and the high precision detection of MEMS was realized. The local magnification was carried out through the microscope objective lens, and the magnification was calibrated by the resolution test chart. Due to the introduction of spherical wave by the magnification of the objective lens, this paper carried out the elimination of the quadratic term error. The shape of the comb tooth was reconstructed by setting a mask in the phase disturbance area. The deformation of the surface before and after voltage applied was measured, and the actual displacement deformation value was solved.
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