Mr. Leszek Frasunkiewicz Profile

Leszek Frasunkiewicz

at Lodz Univ of Technology

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Author

Publications (5)

Proceedings Article | 19 February 2018 Paper

Simplicity VCSELs

Nasibeh Haghighi, Ricardo Rosales, Gunter Larisch, Marcin Gębski, Leszek Frasunkiewicz, Tomasz Czyszanowski, James Lott

Proceedings Volume 10552, 105520N (2018) https://doi.org/10.1117/12.2295028

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Modulation, Quantum efficiency, External quantum efficiency, Quantum wells

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Proceedings Article | 28 April 2016 Paper

Mixed transverse modes in coupled-cavity VCSELs

Leszek Frasunkiewicz, Tomasz Czyszanowski, Kent Choquette, Krassimir Panajotov

Proceedings Volume 9892, 989221 (2016) https://doi.org/10.1117/12.2227845

KEYWORDS: Oxides, Modeling and simulation, Oxidation, Vertical cavity surface emitting lasers, Apertures, Distributed Bragg reflectors, Optical simulations, Gallium arsenide, Thermal effects, Quantum wells, Lasers, Laser damage threshold, Absorbance

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Proceedings Article | 4 March 2015 Paper

VCSEL modeling with self-consistent models: From simple approximations to comprehensive numerical analysis

Maciej Dems, Piotr Beling, Marcin Gębski, Lukasz Piskorski, Jarosław Walczak, Maciej Kuc, Leszek Frasunkiewicz, Michał Wasiak, Robert Sarzała, Tomasz Czyszanowski

Proceedings Volume 9381, 93810K (2015) https://doi.org/10.1117/12.2078321

KEYWORDS: Vertical cavity surface emitting lasers, Computer simulations, Gallium arsenide, Optical simulations, Numerical analysis, Oxides, Mirrors, Physical phenomena, Semiconductor lasers, Laser damage threshold

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Proceedings Article | 2 May 2014 Paper

Coupled-cavity VCSELs: numerical analysis of physical phenomena

Leszek Frasunkiewicz, Maciej Dems, Robert Sarzała, Kent Choquette, Krassimir Panajotov, Tomasz Czyszanowski

Proceedings Volume 9134, 91342C (2014) https://doi.org/10.1117/12.2052602

KEYWORDS: Vertical cavity surface emitting lasers, Physical phenomena, 3D modeling, Calibration, Numerical analysis, Thermal modeling, Semiconductor lasers, Instrument modeling, Gallium arsenide, Finite element methods

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Proceedings Article | 27 February 2014 Paper

Energy efficiency, bit rate, and modal properties of 980 nm VCSELs for very-short-reach optical interconnects

Hui Li, Philip Moser, Philip Wolf, Gunter Larisch, Leszek Frasunkiewicz, Maciej Dems, Tomasz Czyszanowski, James Lott, Dieter Bimberg

Proceedings Volume 9001, 90010B (2014) https://doi.org/10.1117/12.2045780

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Energy efficiency, Optical interconnects, Data transmission, Quantum wells, Temperature metrology, Gallium arsenide, Refractive index

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