Compact short pulse (200 - 350 ps) laser systems using SBS and SRS pulse compression techniques have been constructed. Fine processing of aluminum nitride and silicon wafer has been studied by using these laser pulses and compared with the results processed by 60 femto second laser system. Through-holes are formed on wafers by irradiation of the laser pulses, and the relationship between hole shapes and the processing conditions has been studied. The hole shape relates with the focusing length of the lens, laser fluence, pulse width and the wave length. Trepanning technique has been examined also to improve the hole shape. The result is quite.
The density of states (DOS) near the Fermi level has ben observed by scanning tunneling spectroscopy of La2-xSrxCuO4 and La2-xSrxNiO4 thin films. In La2-xSrxCuO4, the DOS around EF gradually appears with tailing both from the conduction band and the valence band edges accompanied with the increase of carrier concentration. Compared with cuprate thin films, the DOS variation of La2-xSRxNiO4 with carrier increase is slow and no clear differences in the STS are observed in the region with 0.15 < x < 0.5 in the nickelate. However, the DOS of heavily doped La2-xSrxNiO4 with x > 1.0 is quite similar to that of doped cuprates. Systematic investigation of superconducting transition temperatures (Tc) has been performed on the Bi2O2/SrO-inserted infinite-layer lattices, Bi2O2/SrO+(Ca1-xSrxCuO2)n with n equals 2 to 10. The n dependence of Tc varies depending upon the Sr/Ca ratio at alkaline earth metal sites. The observed results are explained by the prediction based on inter-layer effect between two-dimensional resonating valence bond sheets.
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