Dr. Michael Thiel
at Julius-Maximilians-Univ Würzburg
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 4 October 2012
Thomas Esch, Hannes Taubenböck, Achim Roth, Wieke Heldens, Andreas Felbier, Martin Schmidt, Andreas Mueller, Michael Thiel, Stefan Dech
JARS, Vol. 6, Issue 01, 061702, (October 2012) https://doi.org/10.1117/12.10.1117/1.JRS.6.061702
KEYWORDS: Synthetic aperture radar, Time division multiplexing, Spatial resolution, Data modeling, Remote sensing, Image resolution, Satellites, Backscatter, Binary data, Environmental sensing

Proceedings Article | 27 October 2011 Paper
Martin Schmidt, Thomas Esch, Michael Thiel, Stefan Dech
Proceedings Volume 8181, 81810E (2011) https://doi.org/10.1117/12.898348
KEYWORDS: Synthetic aperture radar, Backscatter, Sensors, Image classification, Mathematical morphology, Data acquisition, Scattering, Data modeling, Mathematical modeling, Nanoimprint lithography

Proceedings Article | 10 October 2008 Paper
Michael Thiel, Thomas Esch, Michael Wurm, Hannes Taubenböck, Stefan Dech
Proceedings Volume 7109, 71091B (2008) https://doi.org/10.1117/12.800233
KEYWORDS: Synthetic aperture radar, Speckle, L band, Image segmentation, Image analysis, Spatial resolution, Image classification, Remote sensing, Image filtering, X band

Proceedings Article | 10 October 2008 Paper
H. Taubenböck, T. Esch, M. Wurm, M. Thiel, T. Ullmann, A. Roth, M. Schmidt, H. Mehl, S. Dech
Proceedings Volume 7110, 71100E (2008) https://doi.org/10.1117/12.800272
KEYWORDS: Landsat, Remote sensing, Buildings, Satellites, Sensors, Radar, Analytical research, Spatial resolution, Data modeling, Earth observing sensors

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