Dr. Miklos Fried Profile

Dr. Miklos Fried

at MTA MFA

SPIE Involvement:

Author

Publications (17)

Proceedings Article | 3 March 2022 Paper

Development of silicon nanoparticles for plasmonic sensing

Thomas Defforge, Arnaud Chaix, Benjamin Kalas, Miklos Fried, Peter Petrik, Gael Gautier

Proceedings Volume 11977, 1197706 (2022) https://doi.org/10.1117/12.2609814

KEYWORDS: Silicon, Nanoparticles, Gold, Nanorods, Glasses, Particles, Plasmonics, Thin films, Semiconducting wafers, Silicon films

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Proceedings Article | 2 March 2022 Poster + Paper

Development of advanced sensing materials and interface structures for in-situ bioellipsometry

Benjamin Kalas, Thomas Defforge, Gaёl Gautier, Arnaud Chaix, Miklós Fried, Péter Petrik

Proceedings Volume 11972, 119720G (2022) https://doi.org/10.1117/12.2609882

KEYWORDS: Gold, Glasses, Optical properties, Interfaces, Silicon, Refractive index, Nanoparticles, Thin films, Nanorods, Molecules

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Proceedings Article | 22 June 2015 Paper

Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes

P. Petrik, E. Agocs, B. Kalas, P. Kozma, B. Fodor, J. Nador, C. Major, M. Fried

Proceedings Volume 9529, 95290W (2015) https://doi.org/10.1117/12.2184850

KEYWORDS: Gold, Ellipsometry, Glasses, Adsorption, Plasmons, Spectroscopy, Interfaces, Reflectance spectroscopy, Plasmonics, Resonance enhancement

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Proceedings Article | 22 June 2015 Paper

Expanded beam spectro-ellipsometry for big area on-line monitoring

M. Fried, C. Major, G. Juhasz, P. Petrik, Z. Horvath

Proceedings Volume 9525, 95251S (2015) https://doi.org/10.1117/12.2184713

KEYWORDS: Photovoltaics, Thin films, Zinc oxide, Amorphous silicon, Calibration, Solar cells, Time metrology, Dielectrics, Spectroscopic ellipsometry, Ellipsometry

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Proceedings Article | 21 June 2015 Paper

Methods for optical modeling and cross-checking in ellipsometry and scatterometry

P. Petrik, B. Fodor, E. Agocs, P. Kozma, J. Nador, N. Kumar, J. Endres, G. Juhasz, C. Major, S. Pereira, T. Lohner, H. P. Urbach, B. Bodermann, M. Fried

Proceedings Volume 9526, 95260S (2015) https://doi.org/10.1117/12.2184833

KEYWORDS: Ellipsometry, Scatterometry, Spectroscopy, Spectroscopic ellipsometry, Thin films, Solids, Silicon, Applied physics, Semiconductors, Atomic force microscopy

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Proceedings Article | 8 March 2014 Paper

Optical characterization of laterally and vertically structured oxides and semiconductors

P. Petrik, N. Kumar, E. Agocs, B. Fodor, S. Pereira, T. Lohner, Mi. Fried, H. Urbach

Proceedings Volume 8987, 89870E (2014) https://doi.org/10.1117/12.2042181

KEYWORDS: Ellipsometry, Spectroscopy, Scatterometry, Zinc oxide, Oxides, Dielectrics, Polarimetry, Light sources, Spectroscopic ellipsometry, Image resolution

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Proceedings Article | 6 March 2013 Paper

Single- and double-energy N+ - irradiated planar waveguides in eulytine and sillenite type BGO crystals

I. Bányász, Z. Zolnai, S. Pelli, S. Berneschi, M. Fried, T. Lohner, G. Nunzi-Conti, G. Righini

Proceedings Volume 8627, 862705 (2013) https://doi.org/10.1117/12.2004563

KEYWORDS: Waveguides, Ions, Crystals, Refractive index, Planar waveguides, Spectroscopy, Bismuth, Absorption, Ion beams, Physics

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Proceedings Article | 2 February 2012 Paper

Fabrication of barrier-type slab waveguides in Er3+-doped tellurite glass by single and double energy MeV N+ ion implantation

I. Bányász, Z. Zolnai, S. Pelli, S. Berneschi, G. Nunzi-Conti, M. Fried, T. Lohner, P. Petrik, M. Brenci, G. Righini

Proceedings Volume 8264, 826406 (2012) https://doi.org/10.1117/12.910706

KEYWORDS: Waveguides, Refractive index, Ions, Glasses, Ion implantation, Planar waveguides, Spectroscopy, Optical amplifiers, Data modeling, Erbium

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SPIE Journal Paper | 1 July 2011

Slab optical waveguides in Er³⁺-doped tellurite glass by N⁺ ion implantation at 1.5 MeV

Simone Berneschi, Massimo Brenci, Gualtiero Nunzi Conti, Stefano Pelli, Marco Bettinelli, Adolfo Speghini, István Bányász, Andrea Watterich, Miklós Fried, Tivadar Lohner, Péter Petrik, Nguyen Khanh, Zsolt Zolnai

OE, Vol. 50, Issue 07, 071110, (July 2011) https://doi.org/10.1117/12.10.1117/1.3559209

KEYWORDS: Waveguides, Glasses, Ions, Refractive index, Annealing, Erbium, Ion implantation, Physics, Nitrogen, Temperature metrology

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Proceedings Article | 18 May 2010 Paper

Characterisation of slab waveguides, fabricated in CaF2 and Er-doped tungsten-tellurite glass by MeV energy N+ ion implantation, using spectroscopic ellipsometry and m-line spectroscopy

I. Bányász, S. Berneschi, T. Lohner, M. Fried, P. Petrik, N. Khanh, Z. Zolnai, A. Watterich, M. Bettinelli, M. Brenci, G. Nunzi-Conti, S. Pelli, G. Righini, A. Speghini

Proceedings Volume 7719, 77190G (2010) https://doi.org/10.1117/12.854624

KEYWORDS: Waveguides, Refractive index, Glasses, Ions, Spectroscopy, Crystals, Ion implantation, Annealing, Data modeling, Spectroscopic ellipsometry

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Proceedings Article | 5 February 2008 Paper

Nitrogen-ion-implanted planar optical waveguides in Er-doped tellurite glass: fabrication and characterization

I. Bányász, S. Berneschi, I. Cacciari, M. Fried, T. Lohner, G. Nunzi-Conti, F. Pászti, S. Pelli, P. Petrik, G. Righini, A. Watterich, Z. Zolnai

Proceedings Volume 6890, 68901A (2008) https://doi.org/10.1117/12.768507

KEYWORDS: Refractive index, Waveguides, Glasses, Ions, Spectroscopy, Channel waveguides, Nitrogen, Data modeling, Ion implantation, Phase contrast

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Proceedings Article | 2 March 2007 Paper

Channel waveguides fabrication in Er3+-doped tellurite glass by ion beam irradiation

S. Berneschi, M. Brenci, G. Nunzi Conti, S. Pelli, G. Righini, I. Bányász, A. Watterich, N. Khanh, M. Fried, F. Pászti

Proceedings Volume 6475, 647509 (2007) https://doi.org/10.1117/12.702085

KEYWORDS: Glasses, Channel waveguides, Erbium, Waveguides, Ions, Ion beams, Refractive index, Silicon, Absorption, Optical amplifiers

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Proceedings Article | 3 April 2003 Paper

Phase grating fabrication in glass via ion implantation

Istvan Banyasz, Miklos Fried, Csaba Duecso, Zofia Vertesy

Proceedings Volume 4944, (2003) https://doi.org/10.1117/12.472008

KEYWORDS: Diffraction gratings, Ions, Diffraction, Glasses, Energy efficiency, Ion implantation, Modulation, Nitrogen, Helium, Phase measurement

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Proceedings Article | 19 August 1998 Paper

PC-controlled CCD-matrix-based optical multichannel analyzer for RESPECT measurements

Sz. Forizs, Zoltan Horvath, Tivadar Lohner, Miklos Fried, Istvan Barsony

Proceedings Volume 3573, (1998) https://doi.org/10.1117/12.321018

KEYWORDS: Charge-coupled devices, Spectroscopy, CCD image sensors, Sensors, Software development, Optical fibers, Neural networks, Detector development, Multichannel imaging systems, CCD cameras

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Proceedings Article | 19 August 1998 Paper

Modular PC-controlled polarimetric ellipsometer with variable angle of incidence and spectral options

Tamas Mosoni, P. Petrik, Miklos Fried, Istvan Barsony

Proceedings Volume 3573, (1998) https://doi.org/10.1117/12.320966

KEYWORDS: Sensors, Polarizers, CCD image sensors, Charge-coupled devices, Silicon, Time metrology, Spectroscopy, Statistical analysis, Light sources, Helium neon lasers

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Proceedings Article | 19 August 1998 Paper

Concept of a neural system for real-time evaluation of spectroscopic measurements

L. Redei, Miklos Fried, Tivadar Lohner, O. Polgar, Istvan Barsony, Sz. Forizs, Zoltan Horvath, Josef Humlicek, H. Wallinga

Proceedings Volume 3573, (1998) https://doi.org/10.1117/12.320999

KEYWORDS: Neurons, Computer simulations, Neural networks, Silicon, Logic, Spectroscopy, Error analysis, Device simulation, Optical testing, Oxidation

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Proceedings Article | 18 June 1998 Paper

Fabrication of phase gratings in glass by ion implantation

Istvan Banyasz, Miklos Fried, Csaba Duecso, Zofia Vertesy, Csaba Hajdu

Proceedings Volume 3291, (1998) https://doi.org/10.1117/12.310575

KEYWORDS: Diffraction gratings, Ions, Diffraction, Glasses, Energy efficiency, Modulation, Ion implantation, Scanning electron microscopy, Helium, Nitrogen

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Showing 5 of 17 publications

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