Thermal evaporation technique was used to deposit (Ga0.1In0.9)2Se3 thin films. The optical transmission spectra of (Ga0.1In0.9)2Se3 thin film were studied in the temperature range 77-300 K. Temperature behaviour of the Urbach absorption edge as well as the temperature dependencies of the energy pseudogap and Urbach energy were investigated. The influence of different types of disordering on the optical properties of (Ga0.1In0.9)2Se3 thin film was discussed. Optical parameters of (Ga0.1In0.9)2Se3 thin film and single crystal were compared.
Synthesis of (Ag2S)x(As2S3)1-x superionic glasses for x<0.2 are carried out. The spectrometric studies of optical absorption edge in (Ag2S)x(As2S3)1-x glasses are performed in the temperature range 77-390 K. Optical absorption edge of (Ag2S)x(As2S3)1-x glasses with addition of Ag2S is strongly smeared and has an exponential shape.The influence of temperature and composition on the absorption edge behavior, parameters of optical absorption edge and electronphonon interaction as well as ordering-disordering processes in (Ag2S)x(As2S3)1-x superionic glasses are studied.
(Ga0.4In0.6)2Se3 thin films were deposited by thermal evaporation technique. Refractive index and extinction coefficient dispersions were obtained from the spectral ellipsometry measurements. The dispersion of refractive index is described in the framework of Wemple-DiDomenico model. The energy pseudogap and Urbach energy were determined from the optical absorption spectrum of (Ga0.4In0.6)2Se3 thin film. Optical parameters of (Ga0.4In0.6)2Se3 thin film and single crystal were compared.
TiO2 thin films were deposited on glass substrates by HiTUS (high target utilization sputtering) technique.
Structural studies of TiO2 thin films of different thickness were performed by X-ray diffraction. Refractive index and
extinction coefficient were measured by spectroscopic ellipsometer. Transmission spectra of TiO2 thin films were
investigated in the temperature interval 77-300 K. The temperature behaviour of Urbach absorption edge for TiO2 thin
film was studied. The effect of temperature on the optical parameters and order-disorder processes in TiO2 thin films was
analysed.
Cu6PS5I-based thin films were deposited onto silicate glass substrates by magnetron sputtering. Chemical composition of the thin films was determined by energy-dispersive X-ray spectroscopy. With increasing Cu content, a red shift of the exponential absorption edge energy position as well as a decrease of the Urbach energy are observed. Optical transmission spectra of Cu8.05P0.68S3.54I0.73 thin film were investigated in the temperature interval 77–300 K; the temperature behaviour of the optical absorption spectra and the refractive index dispersion was studied. Temperature dependences of the energy position of the absorption edge, the Urbach energy, and the refractive index of the Cu8.05P0.68S3.54I0.73 thin film were analysed. The influence of structural disorder on the optical properties of the Cu6PS5Ibased thin films is discussed.
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