Dr. Oded Buchinsky
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 July 2000 Paper
Tal Margalith, Amber Abare, Oded Buchinsky, Daniel Cohen, Monica Hansen, A. Stonas, Michael Mack, Evelyn Hu, Steven DenBaars, Larry Coldren
Proceedings Volume 3944, (2000) https://doi.org/10.1117/12.391400
KEYWORDS: Semiconductor lasers, Sapphire, Mirrors, Etching, Gallium nitride, Dielectrics, Reflectivity, Laser damage threshold, Vertical cavity surface emitting lasers, Reactive ion etching

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