KEYWORDS: Light emitting diodes, Filtering (signal processing), Solid state lighting, Statistical analysis, Reliability, Data modeling, Failure analysis, Light sources and illumination, Physics, Control systems
Solid-state lighting (SSL) luminaires containing light emitting diodes (LEDs) have the potential of seeing excessive temperatures during operation or during transportation and storage. Presently, the TM-21 test standard is used to predict the L70 life of SSL Luminaires from LM-80 test data. The underlying TM-21 Arrhenius Model is based on population averages, may not capture the failure physics in presence of multiple failure mechanisms, and does not predict the chromaticity shift. In this paper, Kalman Filter (KF) and Extended Kalman Filters (EKF) have been used to develop models for 70-percent Lumen Maintenance Life Prediction and chromaticity shift for a LEDs used in SSL luminaires. Ten-thousand hour LM-80 test data for various LEDs have been used for model development.
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