Przemyslaw L. Falak
at Univ of Southampton
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 June 2024 Presentation
Martynas Beresna, Przemyslaw Falak, Timothy Lee, Christopher Holmes, Ali Masoudi, David Phillips, Tom Vettenburg, Gilberto Brambilla
Proceedings Volume PC13005, PC130050S (2024) https://doi.org/10.1117/12.3016780
KEYWORDS: Laser scattering, Optical sensing, Optical fibers, Ultrafast lasers, Light scattering, Laser processing, Process control, Optical properties, Laser irradiation, Speckle pattern

Proceedings Article | 23 May 2023 Paper
Przemyslaw Falak, Timothy Lee, Qi Sun, Tom Vettenburg, David Phillips, Gilberto Brambilla, Martynas Beresna
Proceedings Volume 12643, 126432S (2023) https://doi.org/10.1117/12.2678130
KEYWORDS: Polarization, Laser scattering, Speckle pattern, Magnetism, Magnetic sensors, Light scattering, Polarimetry, Glasses, Birefringence, Speckle metrology

Proceedings Article | 17 March 2023 Presentation + Paper
Przemyslaw Falak, Qi Sun, Tom Vettenburg, Timothy Lee, David Phillips, Gilberto Brambilla, Martynas Beresna
Proceedings Volume 12408, 1240806 (2023) https://doi.org/10.1117/12.2648760
KEYWORDS: Fiber Bragg grating interrogators, Fiber Bragg gratings, Scattering, Speckle pattern, Laser scattering, Light scattering, Sensors

Proceedings Article | 5 March 2022 Presentation + Paper
Przemyslaw Falak, Qi Sun, Tom Vettenburg, Timothy Lee, David Phillips, Gilberto Brambilla, Martynas Beresna
Proceedings Volume 12008, 120080E (2022) https://doi.org/10.1117/12.2608748
KEYWORDS: Speckle pattern, Scattering, Spectrometers, Laser scattering, Calibration, Spectral resolution, Light scattering, Humidity, Femtosecond phenomena, Cameras

Proceedings Article | 4 March 2022 Presentation + Paper
M. Beresna, Q. Sun, P. Falak, D. Phillips, T. Vettenburg, A. Masoudi, G. Brambilla
Proceedings Volume 11988, 1198803 (2022) https://doi.org/10.1117/12.2607775
KEYWORDS: Scattering, Laser scattering, Light scattering, Glasses, Spectrometers, Femtosecond phenomena, Optical fibers, Signal detection, Speckle pattern, Refractive index

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