Dr. Qinghua Wang Profile

Dr. Qinghua Wang

at AIST

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 15 February 2024 Paper

Validating the efficacy of deformation distribution measurement in CFRP laminates during three-point bending using the sampling moiré method

Tong Ding, Qinghua Wang, Xiaojun Yan

Proceedings Volume 13069, 130690N (2024) https://doi.org/10.1117/12.3023392

KEYWORDS: Carbon fiber reinforced plastics, Finite element methods, Deformation, Digital image correlation, Boundary conditions, Bending stress, Phase shifts

Read Abstract +

Proceedings Article | 15 February 2024 Paper

Improved video motion magnification method assisted by digital image correlation

Tong Ding, Long Tian, Qinghua Wang

Proceedings Volume 13069, 130691C (2024) https://doi.org/10.1117/12.3023281

KEYWORDS: Digital image correlation, Video, Tunable filters, Motion analysis, Motion measurement, Motion models, Spectrum analysis, Deformation, Vibration

Read Abstract +

Proceedings Article | 15 February 2024 Paper

Application of moiré method for defect detection and strain imaging of silicon single crystals

Qingcui Huang, Qinghua Wang, Xiaojun Yan

Proceedings Volume 13069, 130690L (2024) https://doi.org/10.1117/12.3023360

KEYWORDS: Defect detection, Crystals, Silicon, Transmission electron microscopy, Semiconductors, Distortion, Visualization, Chip manufacturing, Semiconductor materials, Transistors

Read Abstract +

Proceedings Article | 15 February 2024 Paper

Microscale strain distribution measurement before and after crack and delamination occurrence in CFRP laminates by multiplication sampling moiré method

Xinyun Xie, Qinghua Wang, Xiaojun Yan

Proceedings Volume 13069, 130690M (2024) https://doi.org/10.1117/12.3023370

KEYWORDS: Carbon fiber reinforced plastics, Deformation, Background noise, Discontinuities, Phase measurement, Interfaces, Fabrication, Error analysis, Carbon fibers, Materials properties

Read Abstract +

Proceedings Article | 22 May 2023 Presentation + Paper

Deflection measurement of bridges using drone aerial photography based on Moiré phase analysis methodology

Shien Ri, Jiaxing Ye, Qinghua Wang, Nobuyuki Toyama

Proceedings Volume 12327, 1232712 (2023) https://doi.org/10.1117/12.2644940

KEYWORDS: Digital cameras, Inspection, Video, Transportation, Phase distribution, Deformation

Read Abstract +

SPIE Journal Paper | 22 October 2018

Sampling moiré as a special windowed Fourier ridges algorithm in demodulation of carrier fringe patterns

Qian Kemao, Nimisha Agarwal, Shien Ri, Qinghua Wang

OE, Vol. 57, Issue 10, 100503, (October 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.10.100503

KEYWORDS: Fringe analysis, Demodulation, Detection and tracking algorithms, Algorithms, Fourier transforms, Picosecond phenomena, Phase shifts, Error analysis, Optical engineering, Algorithm development

Read Abstract +

Proceedings Article | 10 February 2017 Paper

Influence of working distance on microscale strain measurement under laser scanning microscope from moiré fringes

Qinghua Wang, Yosuke Takashita, Shien Ri, Hiroshi Tsuda, Ryuta Kitamura, Shinji Ogihara

Proceedings Volume 10250, 102501N (2017) https://doi.org/10.1117/12.2266697

KEYWORDS: Microscopes, Laser scanners

Read Abstract +

Proceedings Article | 10 February 2017 Paper

Parallel computing for fast and accurate phase analysis of fringe pattern by two-dimensional phase shifting methods

Shien Ri, Qinghua Wang, Hiroshi Tsuda

Proceedings Volume 10250, 102502Q (2017) https://doi.org/10.1117/12.2266693

KEYWORDS: Fringe analysis, Phase shifts, Parallel computing, Image processing

Read Abstract +

Proceedings Article | 17 July 2015 Paper

Deformation measurement of carbon fiber reinforced plastics using phase-shifting scanning electron microscope Moiré method after Fourier transform

Qinghua Wang, Shien Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa

Proceedings Volume 9524, 95240I (2015) https://doi.org/10.1117/12.2186145

KEYWORDS: Scanning electron microscopy, Phase shifting, Phase shifts, Fourier transforms, Moire patterns, Image filtering, Carbon, Electron microscopes, Image processing, Microscopes

Read Abstract +

Showing 5 of 9 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years