Prof. Reinhard Carius
at Forschungszentrum Jülich GmbH
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 26 April 2016 Paper
Z. Cao, S. Lehnen, R. Carius, K. Bittkau
Proceedings Volume 9890, 98900J (2016) https://doi.org/10.1117/12.2227761
KEYWORDS: Near field scanning optical microscopy, Near field optics, Solar cells, Thin film solar cells, Optical microscopy, Near field scanning optical microscopy, Optical microscopy, Crystals, Light wave propagation, Silicon, Near field, Absorption

Proceedings Article | 21 June 2015 Paper
Markus Ermes, Stephan Lehnen, Zhao Cao, Karsten Bittkau, Reinhard Carius
Proceedings Volume 9526, 95260W (2015) https://doi.org/10.1117/12.2184581
KEYWORDS: Absorption, Near field scanning optical microscopy, Scattering, Optoelectronics, Organic light emitting diodes, Light scattering, Light, OLED lighting, Spatial resolution, Geometrical optics

SPIE Journal Paper | 20 November 2014
Michael Smeets, Vladimir Smirnov, Matthias Meier, Karsten Bittkau, Reinhard Carius, Uwe Rau, Ulrich W. Paetzold
JPE, Vol. 5, Issue 01, 057004, (November 2014) https://doi.org/10.1117/12.10.1117/1.JPE.5.057004
KEYWORDS: Solar cells, Thin film solar cells, Nanostructures, Silver, Prototyping, External quantum efficiency, Plasmonics, Amorphous silicon, Diffraction, Atomic force microscopy

Proceedings Article | 15 May 2014 Paper
Michael Smeets, Vladimir Smirnov, Matthias Meier, Karsten Bittkau, Reinhard Carius, Uwe Rau, Ulrich Paetzold
Proceedings Volume 9140, 91400D (2014) https://doi.org/10.1117/12.2052330
KEYWORDS: Thin film solar cells, Solar cells, Nanostructures, Plasmonics, Silver, Prototyping, External quantum efficiency, Amorphous silicon, Atomic force microscopy, Diffraction

Proceedings Article | 1 May 2014 Paper
Markus Ermes, Stephan Lehnen, Karsten Bittkau, Reinhard Carius
Proceedings Volume 9132, 91320G (2014) https://doi.org/10.1117/12.2052300
KEYWORDS: Near field scanning optical microscopy, Zinc oxide, Light scattering, Laser induced damage, Low pressure chemical vapor deposition, Interfaces, Optical microscopy, Finite-difference time-domain method, Coating, Scattering

Showing 5 of 20 publications
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