Dr. Ricardo Claps Profile

Dr. Ricardo Claps

Patent Agent at Womble Carlyle Sandridge & Rice PLLC

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Publications (5)

SPIE Journal Paper | 1 November 2013 Open Access

Fast, broadband, rugged spectrometer for near-infrared measurements of organic solutions and multicomponent mixtures

Ricardo Claps, Jeffrey Virojanapa

JBO, Vol. 18, Issue 11, 117001, (November 2013) https://doi.org/10.1117/12.10.1117/1.JBO.18.11.117001

KEYWORDS: Glucose, Absorption, Spectroscopy, Near infrared, Water, Clouds, Calibration, Optical filters, Temperature metrology, Bioalcohols

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Proceedings Article | 8 February 2007 Paper

Si/Ge platform for lasers, amplifiers, and nonlinear optical devices based on the Raman effect

Ricardo Claps, Dimitrios Dimitropoulos, Varun Raghunathan, Sasan Fathpour, Bahram Jalali, Bernard Jusserand

Proceedings Volume 6485, 648510 (2007) https://doi.org/10.1117/12.699524

KEYWORDS: Silicon, Phonons, Raman scattering, Germanium, Scattering, Raman spectroscopy, Superlattices, Stereolithography, Acoustics, Optical amplifiers

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Proceedings Article | 18 August 2004 Paper

Wavelength conversion using parametric Raman scattering in silicon microstructures

Bahram Jalali, Varun Raghunathan, Ricardo Claps, Dimitrios Dimitropoulos

Proceedings Volume 5451, (2004) https://doi.org/10.1117/12.549917

KEYWORDS: Waveguides, Silicon, Raman spectroscopy, Signal to noise ratio, Signal attenuation, Raman scattering, Dispersion, Absorption, Birefringence, Phase matching

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Proceedings Article | 19 June 2003 Paper

Nonlinear optics in silicon waveguides: stimulated Raman scattering and two-photon absorption

Dimitrios Dimitropoulos, Ricardo Claps, Yan Han, Bahram Jalali

Proceedings Volume 4987, (2003) https://doi.org/10.1117/12.474363

KEYWORDS: Raman spectroscopy, Raman scattering, Silicon, Waveguides, Scattering, Phonons, Light scattering, Absorption, Polarization, Crystals

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Proceedings Article | 9 December 1999 Paper

Raman measurement in gas flows using a high-power laser diode

Ricardo Claps, Manfred Fink, Philip Varghese

Proceedings Volume 3859, (1999) https://doi.org/10.1117/12.372929

KEYWORDS: Raman spectroscopy, Temperature metrology, Carbon dioxide, High power lasers, Diodes, Semiconductor lasers, Spectroscopy, Laser scattering, Spectral resolution, Absorption

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