Sakshi Sharma
at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12698, 1269804 (2023) https://doi.org/10.1117/12.2681910
KEYWORDS: Perovskite, X-rays, Photovoltaics, X-ray fluorescence spectroscopy, In situ metrology, X-ray optics, X-ray characterization, Design and modelling, X-ray microscopy, Temperature metrology

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