This paper reports demonstration of a new simple white-light interferometry method for continuous dispersion curves of
the thermo-optic (TO) coefficients of optical samples. Phase shifts of the interference spectra of the white-light
interferometer output are measured by changing temperature of an optical sample located in the one of the interferometer
arms. A continuous dispersion curve of the TO coefficient of the sample materials over the full wavelength coverage
region of the white light beam is obtained from the phase shift information with the temperature change. This new
method is tested with a fused silica glass material of well-known optical properties to prove its accuracy by comparing
the measured results with its known TO coefficient values. This continuous dispersion information of the TO
coefficients of new optical materials will be useful for fabrication of the WDM signal processing devices or functional
devices in multi-wavelengths.
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