Dr. Sebastian Naranjo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 May 2023 Presentation + Paper
Proceedings Volume 12499, 1249907 (2023) https://doi.org/10.1117/12.2662423
KEYWORDS: Semiconducting wafers, Metrology, Image segmentation, 3D modeling, Etching, Critical dimension metrology, Artificial intelligence, 3D metrology, Scanning electron microscopy, Image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top