Shuyi Gan
at Univ of Science and Technology of China
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 January 2008 Paper
Shuyi Gan, Yinhe Bao, Yilin Hong, Xiangdong Xu, Ying Liu, Shaojun Fu
Proceedings Volume 6831, 68310G (2008) https://doi.org/10.1117/12.757332
KEYWORDS: Atomic force microscopy, Particles, Surface roughness, Spatial frequencies, Optical simulations, Optical components, Synchrotron technology, Mechanical engineering, Reflectivity, Scattering

Proceedings Article | 27 November 2007 Paper
Shuyi Gan, Qing Zhou, Yilin Hong, Xiangdong Xu, Ying Liu, Hongjun Zhou, Tonglin Huo, Shaojun Fu
Proceedings Volume 6723, 67232R (2007) https://doi.org/10.1117/12.783328
KEYWORDS: Surface roughness, Atomic force microscopy, Silicon, Spatial frequencies, Glasses, Data acquisition, Probability theory, Spectral data processing, Silica, Semiconducting wafers

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