Mr. Sih-Yue Chen Profile

Sih-Yue Chen

at National Sun Yat-Sen Univ

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Publications (8)

Proceedings Article | 5 October 2023 Poster + Paper

Error-controlled decoding in phase unwrapping for phase-shifting projected fringe profilometry

Wei-Hung Su, Pei-Chi Li, Sih-Yue Chen

Proceedings Volume 12682, 126820A (2023) https://doi.org/10.1117/12.2677314

KEYWORDS: Phase unwrapping, Phase shifts, Fringe analysis, Discontinuities, Inspection, Phase distribution, 3D projection, Signal to noise ratio, 3D metrology, Surface roughness

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Proceedings Article | 20 August 2020 Poster + Paper

Pulsed-encoded pattern projections for phase-shifting projected fringe profilometry

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 11498, 114980W (2020) https://doi.org/10.1117/12.2572295

KEYWORDS: Phase shifts, Fringe analysis, Inspection, 3D metrology, Calibration, Projection systems

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Proceedings Article | 9 September 2019 Paper

Profile measurements using contrast-encoded pattern projections

Nai-Jen Cheng, Sih-Yue Chen, Wei-Hung Su

Proceedings Volume 11123, 111230U (2019) https://doi.org/10.1117/12.2530714

KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Inspection, Phase measurement, Adaptive optics, Bromine, Calibration, Projection systems, CCD cameras

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Proceedings Article | 4 September 2018 Paper

Profile measurements for specular objects using binary-encoded patterns

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, 1075513 (2018) https://doi.org/10.1117/12.2323815

KEYWORDS: Fringe analysis, Inspection, Mirrors, Binary data, CCD cameras, Calibration, 3D metrology, Robotics, Metals, Transmittance

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Proceedings Article | 4 September 2018 Paper

One shot projected fringe profilometry using a 2D fringe-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, 1075511 (2018) https://doi.org/10.1117/12.2323809

KEYWORDS: Inspection, Fringe analysis, 3D metrology, Fourier transforms, Cameras, Projection systems, CCD cameras, Optoelectronics, Sun, Reflectivity

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Proceedings Article | 23 August 2017 Presentation + Paper

Phase-shifting projected fringe profilometry using ternary-encoded patterns

Sih-Yue Chen, Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 10382, 103820U (2017) https://doi.org/10.1117/12.2275325

KEYWORDS: Fringe analysis, Phase shifts, Optical inspection, Data processing, Reliability, Photonic devices

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Proceedings Article | 23 August 2017 Presentation + Paper

One shot profile measurements using a binary-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10382, 103820T (2017) https://doi.org/10.1117/12.2275322

KEYWORDS: Fringe analysis, Reflectivity, Optical inspection, Inspection, Cameras, Photonic devices

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Proceedings Article | 7 September 2016 Paper

Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Nai-Jeng Cheng, Sih-Yue Chen, Wei-Hung Su

Proceedings Volume 9958, 995819 (2016) https://doi.org/10.1117/12.2240067

KEYWORDS: Fringe analysis, Phase shifts, Computer programming, Reflectivity, Binary data, Inspection, Transmittance, 3D metrology, Time metrology, Photonic crystal fibers

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Showing 5 of 8 publications

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