Dr. Soohong Kim Profile

Dr. Soohong Kim

at Siemens EDA

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 16 September 2022 Paper

Checkpointing in EDA application for tapeout operation

Kuang Han Chen, Soohong Kim, Hien Vu, Stephen Kim, Ming Feng Shen

Proceedings Volume 12325, 1232507 (2022) https://doi.org/10.1117/12.2641214

KEYWORDS: Optical proximity correction, Photomasks, Electronic design automation, Resolution enhancement technologies, SRAF, Data storage, Semiconducting wafers, Scattering

Read Abstract +

Proceedings Article | 12 October 2021 Presentation + Paper

Benefits of an integrated pipelined flow for curvilinear MPC and multibeam fracture

Apurva Bajpai, Rachit Sharma, Amanda Bowhill, Stephen Kim, Soohong Kim

Proceedings Volume 11855, 118550V (2021) https://doi.org/10.1117/12.2601100

KEYWORDS: Data processing, Photomasks, Semiconductor manufacturing, Parallel processing

Read Abstract +

Proceedings Article | 20 March 2018 Presentation + Paper

A novel processing platform for post tape out flows

Hien Vu, Soohong Kim, James Word, Lynn Cai

Proceedings Volume 10587, 105870R (2018) https://doi.org/10.1117/12.2297240

KEYWORDS: Optical proximity correction, Photomasks, Data processing, Resolution enhancement technologies, SRAF, Computing systems, Parallel processing, Integrated circuits, Design for manufacturability

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years