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Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material
The results are applicable for radiation in a broader spectrum including microwaves and gamma radiation.
In this paper, we investigate the correlation tensor for stochastic electromagnetic fields modulated by a depolarizer consisting of a rough-surfaced retardation plate. Under the assumption that the microstructure of the scattering surface on the depolarizer is as fine as to be unresolvable in our observation region, we have derived a relationship between the polarization matrix/coherency matrix for the modulated electric fields behind the rough-surfaced retardation plate and the coherence matrix under the free space geometry. This relation is regarded as entirely analogous to the van Cittert-Zernike theorem of classical coherence theory. Within the paraxial approximation as represented by the ABCD-matrix formalism, the three-dimensional structure of the generated polarization speckle is investigated based on the correlation tensor, indicating a typical carrot structure with a much longer axial dimension than the extent in its transverse dimension.
In this work we present a method for measuring the RMS-values of the surface roughness while simultaneously determining the polishing direction. We are mainly interested in the RMS-values in the range from 0 – 100 nm, which corresponds to the finish categories of A1, A2 and A3. Based on simple intensity measurements we estimates the RMS-value of the surface roughness, and by using a sectioned annual photo-detector to collect the scattered light we can determine the direction of polishing and distinguish light scattered from random structures and light scattered from scratches.
Selectivity of spatial filtering velocimetry of objective speckles for measuring out-of-plane motion
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