Dr. Tong Chen
at Air Force Engineering University
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 October 2024 Paper
Proceedings Volume 13287, 132870C (2024) https://doi.org/10.1117/12.3037853
KEYWORDS: Annealing, Reflectivity, Laser ablation, Femtosecond phenomena, Reflection

Proceedings Article | 30 August 2019 Paper
Proceedings Volume 11101, 111010C (2019) https://doi.org/10.1117/12.2528299
KEYWORDS: Silicon, Antireflective coatings, Thermal effects, Femtosecond phenomena, Laser processing, Reflectivity, Laser irradiation, Semiconducting wafers, Reflection

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