Dr. Vismay Trivedi Profile

Dr. Vismay Trivedi

at National Institute Of Technology, Delhi

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Author

Publications (10)

Proceedings Article | 15 August 2023 Poster + Paper

Shape measurement of phase objects using fringe projection technique

V. Trivedi, M. Joglekar, S. Utadiya, N. Chhiller, S. Sharma, G. Sheoran, A. Anand

Proceedings Volume 12618, 126182S (2023) https://doi.org/10.1117/12.2673865

KEYWORDS: Fringe analysis, Phase measurement, Phase distribution, Modulation, Geometrical optics, 3D metrology, Refractive index, Optical components

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Proceedings Article | 2 March 2022 Presentation

Structured unknown-illumination based super-resolved label free imaging

Gal Chen, Abhijit Sanjeev, Vismay Trivedi, Javier Garcia, Ricardo Rubio, Zeev Zalevsky

Proceedings Volume PC11972, PC1197204 (2022) https://doi.org/10.1117/12.2608555

KEYWORDS: Image resolution, Computer programming, Imaging systems, Super resolution, Multiplexing, Diffraction

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Proceedings Article | 22 July 2019 Paper

Wide field of view self-referencing quantitative phase contrast microscopy based on Lloyd’s mirror interferometer

Mugdha Joglekar, Vismay Trivedi, Swapnil Mahajan, Vani Chhnaiwal, Rainer Leitgeb, Giancarlo Pedrini, Bahram Javidi, Arun Anand

Proceedings Volume 11076, 110760S (2019) https://doi.org/10.1117/12.2526568

KEYWORDS: Holograms, Microscopy, Digital holography, Microscopes, Phase contrast, Interferometers, Holography, Blood, Diffraction

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Proceedings Article | 22 July 2019 Presentation

Digital holography for quantification of semiconductor structures (Conference Presentation)

Vismay Trivedi, Nimit Patel, Mugdha Joglekar, Vani Chhaniwal, Seonoh Lee, Arun Anand

Proceedings Volume 11056, 1105609 (2019) https://doi.org/10.1117/12.2525684

KEYWORDS: Digital holography, Semiconductors, Holography, Holograms, Holographic interferometry, Optical design, Phase imaging, Thin films, Glasses, Inspection

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Digital holography interferometry (DHI) and digital holographic interference microscopy (DHIM) are tools that provide whole field information of the wavefront interacting with the object. This imaging modality can be an ideal tool for quantitative phase imaging of technical objects such as semiconductor samples. The phase information numerically reconstructed from the holograms can lead to extraction of the thickness/height of the sample. Usually DHI and DHIM are used in transmission mode for determination of optical thickness of the sample under investigation. In reflection mode this imaging techniques provide height of the sample. For the semiconductor industry determination of height/thickness of object structures as well as the quantification of defects in the object structures is an important issue. The thickness and defect determination can be that of semiconductor thin films, micro/nano-pillars, LED displays, liquid crystal panels, the cover glasses used for protection of these structures etc. Digital holographic interferometric method (both reflection and transmission) can be used to design devices that can act as a fast, single shot technique for quantitative phase imaging of such samples. Such devices can provide more information about the sample compared to intensity based measurement systems. Also compact the digital holographic interferometric systems can be deployed in the manufacturing line of such devices to provide real time information. We are involved in the design and development of digital holographic devices for inspection of semi-conductor wafers, thin films, displays and glass plates covering such samples. We have implemented digital holographic devices in the lens-less mode (in the case of DHI) and also with the use of an imaging lens (in the case of DHIM) both in reflection and transmission mode. DHI provides field of view equivalent to the sensor size, while DHIM technique was implemented with different magnifications, thereby providing varying field of views of the sample. Also in the case of DHI a propagation from the hologram plane (the plane at which the digital array for recording the hologram was situated) to the best focus plane (object plane) was realized by numerical implementation of diffraction integral. In DHIM, the digital array used for recording the hologram was at the image plane of the magnifying/de-magnifying lens. So the whole numerical reconstruction process reduced to Fourier fringe analysis, making the technique less computationally exhaustive, fast and quasi real-time. The developed devices were calibrated using known objects and then tested on different samples. The obtained results are found to be encouraging. In this paper, we describe our efforts in design, development and fabrication of digital holographic devices for the inspection of semiconductor samples.

SPIE Journal Paper | 5 January 2019

Portable device based on beam deflection for refractive index mapping and diffusion coefficient measurement

Vismay Trivedi, Mugdha Joglekar, Swapnil Mahajan, Vani Chhaniwal, Bahram Javidi, Arun Anand

OE, Vol. 58, Issue 01, 014101, (January 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.1.014101

KEYWORDS: Refractive index, Diffusion, Liquids, Image analysis, Image processing, Binary data, Laser beam diagnostics, Optical engineering, Imaging systems, Holography

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SPIE Journal Paper | 12 December 2017 Open Access

Wide field of view common-path lateral-shearing digital holographic interference microscope

Priyanka Vora, Vismay Trivedi, Swapnil Mahajan, Nimit Patel, Mugdha Joglekar, Vani Chhaniwal, Ali-Reza Moradi, Bahram Javidi, Arun Anand

JBO, Vol. 22, Issue 12, 126001, (December 2017) https://doi.org/10.1117/12.10.1117/1.JBO.22.12.126001

KEYWORDS: Digital holography, Microscopes, Holography, Holograms, Charge-coupled devices, Wavefronts, Sensors, CCD image sensors, 3D image processing, Biomedical optics

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Proceedings Article | 28 July 2017 Paper

Imaging the effect of hemoglobin on properties of RBCs using common-path digital holographic microscope

M. Joglekar, H. Shah, V. Trivedi, S. Mahajan, V. Chhaniwal, R. Leitgeb, B. Javidi, A. Anand

Proceedings Volume 10414, 104140W (2017) https://doi.org/10.1117/12.2286038

KEYWORDS: Digital holography, Holography, Microscopes, Microscopy, Stereoscopy

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Proceedings Article | 22 June 2015 Paper

Diffusivity measurement using compact low cost field portable device based on light deflection

Vani Chhaniwal, Swapnil Mahajan, Vismay Trivedi, Arun Anand

Proceedings Volume 9525, 95253W (2015) https://doi.org/10.1117/12.2184789

KEYWORDS: Diffusion, Liquids, Refractive index, Binary data, Interferometry, Imaging devices, Image processing, Physics, Light emitting diodes, Pollution control

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Proceedings Article | 22 June 2015 Paper

Measurement of concentration of sugar in solutions with laser speckle decorrelation

Swapnil Mahajan, Vismay Trivedi, Vani Chhaniwal, Mahendra Prajapati, Zeev Zalevsky, Bahram Javidi, Arun Anand

Proceedings Volume 9525, 95253H (2015) https://doi.org/10.1117/12.2184698

KEYWORDS: Speckle pattern, Speckle, Polarization, Diffusers, Sensors, Calibration, Active optics, Optical testing, Glucose, Semiconductor lasers

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Proceedings Article | 5 June 2014 Paper

Self-referencing digital holographic microscope for dynamic imaging of living cells

Arun Anand, Vani Chhaniwal, Swapnil Mahajan, Vismay Trivedi, Amardeep Singh, Rainer Leitgeb, Bahram Javidi

Proceedings Volume 9117, 91170X (2014) https://doi.org/10.1117/12.2050415

KEYWORDS: Digital holography, Holograms, Microscopes, Holography, Wavefronts, Phase contrast, Objectives, Blood, Sensors, Microscopy

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Showing 5 of 10 publications

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