Mr. Wilhelm Eschen Profile

Wilhelm Eschen

at Friedrich-Schiller-Univ Jena

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Author

Publications (4)

Proceedings Article | 13 March 2024 Poster + Paper

Correlative extreme ultraviolet, visible, infrared, and fluorescence microscopy in a single lensless imaging setup

L. Licht, C. Liu, W. Eschen, D. Penagos Molina, J. Reinhard, S. Kaleta, J. Limpert, C. Eggeling, J. Rothhardt

Proceedings Volume 12857, 128570I (2024) https://doi.org/10.1117/12.3002264

KEYWORDS: Extreme ultraviolet, Fluorescence, Infrared imaging, Biological samples, Fluorescence microscopy, Biological imaging, Light sources and illumination, Microscopy, Image resolution, Visible radiation

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Proceedings Article | 9 August 2023 Paper

EUV ptychography: material-specific imaging at the nanoscale

J. Rothhardt, Wilhelm Eschen, Cheng Liu, Daniel Penagos M., Robert Klas, Jens Limpert

Proceedings Volume 12621, 126210V (2023) https://doi.org/10.1117/12.2678398

KEYWORDS: Extreme ultraviolet, Scattering, Biological samples, Biological imaging, Microscopes, Silicon, Integrated circuits, Chemical composition, Stars, Semiconductors

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Proceedings Article | 11 November 2022 Presentation

Material-specific high-resolution extreme ultraviolet microscopy using a high-order harmonic source

Wilhelm Eschen, Lars Loetgering, Vittoria Schuster, Robert Klas, Alexander Kirsche, Lutz Berthold, Michael Steinert, Thomas Pertsch, Michael Krause, Jens Limpert, Jan Rothhardt

Proceedings Volume PC12292, PC122920O (2022) https://doi.org/10.1117/12.2641705

KEYWORDS: Extreme ultraviolet, Microscopy, Ultraviolet radiation, Stars, Silicon, Silica, Scattering, Refractive index, Microscopes, Metrology

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Proceedings Article | 5 March 2021 Paper

Ultrafast nanoscale XUV table-top coherent diffractive imaging

Wilhelm Eschen, Vittoria Schuster, Sici Wang, Lars Loetgering, Chang Liu, Robert Klas, Jens Limpert, Jan Rothhardt

Proceedings Volume 11676, 116761B (2021) https://doi.org/10.1117/12.2578527

KEYWORDS: Coherence imaging, Extreme ultraviolet, Ultrafast imaging, Synchrotrons, Spatial resolution, Photomasks, Lithography, Temporal resolution, Temporal coherence, Metrology

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