William Ethan Maguire
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12953, 129531A (2024) https://doi.org/10.1117/12.3010983
KEYWORDS: Reflectivity, Photomasks, Reflection, Polarization, Extreme ultraviolet lithography, Apodization, Multilayers, Extreme ultraviolet, Silicon

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12494, 124940H (2023) https://doi.org/10.1117/12.2660823
KEYWORDS: Refractive index, Systems modeling, Extreme ultraviolet, Phase shifts, Composites, Modeling, Dielectrics, Phase shifting, Lithography, EUV optics, 3D mask effects

Proceedings Article | 28 April 2023 Presentation + Paper
Proceedings Volume 12494, 124940P (2023) https://doi.org/10.1117/12.2660861
KEYWORDS: Wavefronts, Wavefront errors, Lenses, Lithography, Zernike polynomials, Singular value decomposition, Monochromatic aberrations, Simulations, Wavefront aberrations, Optical aberrations

Proceedings Article | 28 April 2023 Paper
Proceedings Volume 12494, 124941E (2023) https://doi.org/10.1117/12.2658756
KEYWORDS: Diffraction, Extreme ultraviolet, Modeling, Systems modeling, Lenses, Diffusion, Reflectivity, Source mask optimization, Optical lithography, Nanoimprint lithography

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top