Prof. Xing Zhu Profile

Prof. Xing Zhu

Dean of Science at Peking Univ

SPIE Involvement:

Editor | Author

Proceedings Article | 3 November 2016 Paper

Unidirectional propagation of surface plasmons under active control

Huang Tao, Jiajian Wang, Ziwei Li, Wei Liu, Feng Lin, Zheyu Fang, Xing Zhu

Proceedings Volume 10028, 100281B (2016) https://doi.org/10.1117/12.2247752

KEYWORDS: Spiral phase plates, Surface plasmons, Near field scanning optical microscopy, Finite-difference time-domain method, Plasmonics, Light wave propagation, Photons, Gold, Polarization, Surface plasmon polaritons

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Proceedings Article | 4 January 2008 Paper

Micro-cylinder mode in photonic quasicrystal observed by near-field optical microscopy

Zheyu Fang, Tao Dai, Bei Zhang, Xing Zhu

Proceedings Volume 6831, 683102 (2008) https://doi.org/10.1117/12.767590

KEYWORDS: Near field scanning optical microscopy, Gallium nitride, Light emitting diodes, Near field, Near field optics, Waveguides, Photonic crystals, Photonic microstructures, Optical microscopy, Radio propagation

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Proceedings Article | 9 February 2005 Paper

Study on near-field optical imaging mechanism

Qing Zhou, Xing Zhu, Hong Dai

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.576929

KEYWORDS: Near field, Near field scanning optical microscopy, Finite-difference time-domain method, Dielectric polarization, Nanolithography, Polarization, Computer simulations, Optical microscopes, Dielectrics, 3D image processing

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We present three-dimensional simulations of the image formation of microstructure in near-field optical microscopy with the three-dimensional finite-difference time-domain method (FDTD). First, we calculated the intensity distributions inside and outside and the flux densities for both the tapered and parabolic fiber probes used in near-field optical microscope and nanolithography. The calculating result shows that for different kinds of shape the intensity distributions in both probes are similar and present standing wave forms; but the amplitudes and locations of peaks of the standing waves are different from each other. The intensity outward parabolic probe is higher than that outward tapered probe. Then we computed the intensity distributions of the samples which are composed of different materials by different polarization illumination. Assuming an aperture-type probe in collection-mode near-field microscope, we compare the images produced from the sample composed of three dielectric blocks in nanometer at a distance of 25nm and 150nm, respectively, under constant-high-scanning mode along with the direction of the polarization of the illuminating light, with near-field distribution of the sample without probe. The results show that the probe disturbs the original field distribution of the sample. The received signal is different from the original field distribution of the sample. However the received signal contains high frequency information of the sample in near-field region. Due to probe-sample interaction, parts of evanescent field transform into propagation wave. Only the interaction between the probe and sample in the near field makes possible to probe the high-frequency components and achieve the super-resolution. Therefore, the detected resolution depends on an assembly of the tip size, shape of the tip, distance between tip and sample, relative position and material characteristics of both tip and sample. These results provide the basis for correct interpretation of experimental work.

Proceedings Article | 9 February 2005 Paper

High spatial resolution investigation of electroluminescence of InGaN/GaN multiple quantum wells by using scanning near-field optical microscopy and spectroscopy

Weihua Zhang, Gengzhao Xu, Xing Zhu

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.570641

KEYWORDS: Near field scanning optical microscopy, Electroluminescence, Light emitting diodes, Indium, Quantum wells, Indium gallium nitride, Gallium nitride, Spatial resolution, Spectroscopy, Green light emitting diodes

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The electro-luminescence (EL) properties of InGaN/GaN multiple quantum wells (MQWs) light emitting diodes (LEDs) with various emitting wavelength (purple, blue and green) were studied by scanning near-field optical microscope (SNOM). The high spatial resolution EL SNOM mappings and near-field spectra of the LEDs were acquired at various injection current conditions. The experiment shows that, though there are some common points, the EL properties of various LEDs are quite different. (i) The EL mappings show that the MQWs emission is spatially inhomogenous, which contain many islands like bright spots. (ii) The sizes of the bright spots are different ranging from 0.1 μm to 1μm, the LED with longer emitting wavelength has larger bright spots. (iii) The injection current dependences of the shape of the bright spots of various LEDs are different. (iv) The emission wavelengths of brighter spots are longer in the same LED. (v) Increasing the injection current, the full widths at half maximum (FWHM) of the EL spectra grow larger. With the same injection current, the green LED has larger FWHMs than the blue and purple ones. (vi) Increasing the injection current, the blue shift of the green LED is obviously (~60 meV), but those of the blue one and purple are negligible. The phenomena above suggest that, the self-organized In-rich regions play a key role in the emission of all the InGaN/GaN MQWs LEDs, though they have different influences on the emission properties of the three LEDs with various emission wavelengths. One possible explanation is that, in the blue and purple LEDs, because the size of the In-rich areas are small, the quantum confined Stark effect caused by the piezoelectric field is negligible; but in the green LED, the In-rich areas are larger, the quantum confined Stark effect is obvious which caused the blue shift phenomenon. And in all LEDs, the band filling effect makes the FWHMs of the emission spectra larger. The results also show that SNOM is a powerful tool to study the local light emission properties at nanometer scale.

Proceedings Article | 9 February 2005 Paper

Visualizing substructure of Ca²⁺ waves by total internal reflection fluorescence microscopy

Yongqiang Bai, Aihui Tang, Shiqiang Wang, Xing Zhu

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.580734

KEYWORDS: Calcium, Luminescence, Wave propagation, Objectives, Wavefronts, Visualization, Microscopy, Confocal microscopy, Microscopes, Near field optics

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Proceedings Article | 5 September 2002 Paper

Three-dimensional modeling of near-field imaging in subwavelength periodic structures

Qing Zhou, Xing Zhu, Hong Dai, Erda Pan

Proceedings Volume 4923, (2002) https://doi.org/10.1117/12.481716

KEYWORDS: Near field, 3D modeling, Dielectric polarization, Finite-difference time-domain method, 3D image processing, Near field scanning optical microscopy, Dielectrics, Wave propagation, Near field optics, Electromagnetism

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Proceedings Article | 9 November 1999 Paper

InGaAlP quantum well microcavities of circular or deformed disks and disks with microstructures

Bei-Wei Zhang, Guozhong Wang, YunQing Chen, Dai Lun, Wei Fang, Dajun Wang, Yumin Shen, Yi Qian, Shifa Xu, ZhiAn Lai, Xing Zhu, Ruo Peng Wang, Xiaoyu Ma

Proceedings Volume 3899, (1999) https://doi.org/10.1117/12.369402

KEYWORDS: Semiconducting wafers, Scanning electron microscopy, Quantum wells, Luminescence, Etching, Waveguides, Near field optics, Optical microcavities, Cladding, Atomic force microscopy

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Proceedings Article | 9 November 1999 Paper

Optical properties of InGaN multiple quantum well microdisks

Dai Lun, Bei-Wei Zhang, Yu Zhang, Ruo Peng Wang, Xing Zhu, Jing Lin, Hongxing Jiang

Proceedings Volume 3899, (1999) https://doi.org/10.1117/12.369401

KEYWORDS: Near field scanning optical microscopy, Near field optics, Optical properties, Indium gallium nitride, Quantum wells, Luminescence, Excitons, Optical microcavities, Optical filters, Ion beams

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Proceedings Article | 22 September 1999 Paper

Cryogenic near-field microscope working at LN temperature

Yan Yin, Xing Zhu, Teng Fei, Shifa Xu, Hetian Zhou, Zizhao Gan, Feijun Song

Proceedings Volume 3791, (1999) https://doi.org/10.1117/12.363856

KEYWORDS: Near field scanning optical microscopy, Near field optics, Near field, Scanners, Nitrogen, Head, Signal detection, Cryogenics, Spectroscopy, Imaging spectroscopy

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Proceedings Article | 22 September 1999 Paper

Mode study of the light emission distribution in semiconductor microdisks by using near-field optical microscopy

Yu Zhang, Xing Zhu, Dai Lun, Hetian Zhou, Ruo Peng Wang, Yongchun Xin, Guozhong Wang, Shifa Xu, Yumin Shen, Bei-Wei Zhang, Guoyi Zhang, Zizhao Gan, Feijun Song

Proceedings Volume 3791, (1999) https://doi.org/10.1117/12.363855

KEYWORDS: Near field, Near field optics, Gallium nitride, Luminescence, Indium gallium phosphide, Indium gallium nitride, Semiconductors, Near field scanning optical microscopy, Optical microscopy, Optical microcavities

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Proceedings Article | 22 September 1999 Paper

Study of field distribution of the probes in scanning near-field optical microscopy using finite-difference time-domain calculations

Qing Zhou, Xing Zhu, Changqing Wang, Hetian Zhou

Proceedings Volume 3791, (1999) https://doi.org/10.1117/12.363857

KEYWORDS: Near field scanning optical microscopy, Finite-difference time-domain method, Dielectric polarization, Metals, 3D modeling, Near field optics, Maxwell's equations, Optical fibers, Electromagnetism, Scanning electron microscopy

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Proceedings Article | 13 October 1998 Paper

Progress of near-field optics research: activities in China

Xing Zhu, Feijun Song

Proceedings Volume 3467, (1998) https://doi.org/10.1117/12.326820

KEYWORDS: Near field scanning optical microscopy, Near field optics, Near field, Imaging spectroscopy, Spectroscopy, Physics, Scanning tunneling microscopy, Optical microscopes, Spectroscopes, Ultrasonics

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Proceedings Article | 13 October 1998 Paper

Study of whispering-gallery mode of InGaP microdisks using scanning near-field optical microscopy

Xing Zhu, Yu Zhang, Yongchun Xin, Yong Ling, Ke Wu, Hetian Zhou, Yan Yin, Bei-Wei Zhang, Zizhao Gan, Feijun Song, Yu Wang

Proceedings Volume 3467, (1998) https://doi.org/10.1117/12.326823

KEYWORDS: Indium gallium phosphide, Near field scanning optical microscopy, Luminescence, Near field optics, Near field, Spectroscopy, Optical microscopy, Optical microcavities, Liquids, Nitrogen

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Proceedings Article | 13 October 1998 Paper

Near-field spectroscopy of GaN blue light emission diode

Yong Ling, Hetian Zhou, Xing Zhu, Yu Zhang, Yan Yin, Ke Wu, Guoyi Zhang, Zhijian Yang, Yuzhen Tong, Sixuan Jin, Zizhao Gan, Feijun Song, Yu Wang

Proceedings Volume 3467, (1998) https://doi.org/10.1117/12.326822

KEYWORDS: Gallium nitride, Near field, Spectroscopy, Diodes, Near field scanning optical microscopy, Annealing, Near field optics, Luminescence, Optical microscopy, Optical spectroscopy

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