Yang Lu
at Micron Technology Inc
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 6 February 2024
JM3, Vol. 23, Issue 01, 011207, (February 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.1.011207
KEYWORDS: Vestigial sideband modulation, Semiconducting wafers, Optical proximity correction, SRAF, Critical dimension metrology, Lithography, Printing, Design, Scanning electron microscopy, Photomask technology

Proceedings Article | 7 October 2020 Presentation + Paper
Proceedings Volume 11518, 115180W (2020) https://doi.org/10.1117/12.2579729

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