In optical lithography, aberrations induced by lens heating effects of a projection lens lead to degradation of imaging quality. In order to compensate for thermal aberrations, it is crucial to apply an accurate method for thermal aberration prediction. An effective and accurate method for thermal aberration prediction is proposed. A double exponential model is modified in respect of the timing of exposure tools, and a particle filter is used to adjust the double exponential model. Parameters of the model are updated recursively pursuant to the aberration data measured during the exchange of wafers. The updated model is used to predict thermal aberrations during the following exposure of wafers. The performance of the algorithm is evaluated by the simulation of a projection lens for argon fluoride lithography. Simulation results show that predictive errors of primary defocus and astigmatism are significantly reduced, and the mean value of wavefront error in the whole field of view is reduced by about 30% in a vertical line/space pattern. The proposed method is easily adaptable to different types of aberration measurement error.
In optical lithography tools, thermal aberration of a projection lens, which is caused by lens heating effect, leads to degradation of imaging quality. In addition to in-line feedforward compensation technology, thermal aberration can be reduced by optimizing optical design of a projector. Thermal aberration analysis of a projection lens benefits the optimization of optical design. A model of lens heating effect for a lithographic projector is introduced, which is capable of evaluating the synthetical thermal aberration of a projector as well as analyzing the contribution of an individual optical element. Simulation results by the introduced model show that not only the deformation of lens surface, the variance of refractive index but also the change of optical path, which depends on optical design, should be considered in thermal aberration analysis. The contributions of optical elements at different locations of the projector are also analyzed. Based on the model and the simulation results, an optimization method is proposed. A projector for i-line lithography is optimized by the proposed method. Main aberrations Z5, Z9, and Z17 are reduced by about 40%. The image quality of the lithographic projector in steady state is also improved.
In optical lithography, lens heating induced aberrations of a projection lens lead to degradation of imaging quality. In order to accurately compensate for thermal aberrations by integrated manipulators in projection lens, it is crucial to apply an accurate method for thermal aberration prediction. In this paper, an effective and accurate method for thermal aberration prediction is proposed. Double exponential model is simplified in respect of the timing of exposure tools, and particle filter is used to adjust the parameters of the double exponential model. Parameters of the simplified model are updated recursively pursuant to the aberration data measured during the exchange of wafers. The updated model is used to predict thermal aberrations of the lens during the following exposure of wafer. The performance of the algorithm is evaluated by simulation of a projection lens for ArF lithography. Maximum root mean square (RMS) value of perdition error of thermal aberration under annular illumination and dipolar illumination are reduced by 68.3% and 76.1%, respectively. The proposed method is also of well adaptability to different types of aberration measurement error.
In optical lithography tools, thermal aberration of a projection lens, which is caused by lens heating, leads to degradation of imaging quality. In addition to in-line feedforward compensation technology [1], the thermal aberration can be reduced by optimizing projection lens design. Thermal aberration analysis of a projection lens benefits the optimization of projection lens design. In this paper, thermal aberration analysis methods using physical model and simplified model are compared. Physical model of lens heating provides accurate thermal aberration analysis, but it is unable to analyze the contribution of an element of the lens to thermal aberration which is significant for thermal optimization[2]. Simplified model supports thermal analysis of an element of a lens[3]. However, only the deformation of lens surface and the variance of refractive index are considered in the simplified model. The thermal aberration analysis, in this paper, shows not only the deformation of lens surface, the variance of refractive index but also the change of optical path should be considered in thermal aberration analysis. On the basis of the analysis, a strategy for optimizing projection lens design is proposed and used to optimize thermal behavior of a lithography projection lens. The RMS value of thermal aberration is reduced by 31.8% in steady state.
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