Yi Li
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 January 2018 Paper
Proceedings Volume 10620, 106200U (2018) https://doi.org/10.1117/12.2284776
KEYWORDS: Edge detection, Fractal analysis, Image enhancement, Image processing, Super resolution, Reconstruction algorithms, Image segmentation, Convolutional neural networks

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