Dr. Yoram Karni Profile

Dr. Yoram Karni

CTO at SCD SemiConductor Devices

SPIE Involvement:

Author

Publications (21)

Proceedings Article | 7 June 2024 Presentation + Paper

Presentation + Paper

SWIFT: a low SWaP wide distribution SWIR product line

A. Fraenkel, R. Elishkov, G. Reches, E. Louzon, C. Jakobson, R. Dobromislin, N. Ben Ari, M. Labilov, M. Alcheck, Y. Lury, H. Mary, E. Almog, M. Nitzani, Y. Karni, T. Markovitz, B. Milgrom, M. Richardson

Proceedings Volume 13046, 1304603 (2024) https://doi.org/10.1117/12.3012859

KEYWORDS: Short wave infrared radiation, Quantum imaging, Pulsed laser operation, Staring arrays, Video, Single crystal X-ray diffraction, Readout integrated circuits, Indium gallium arsenide, Imaging systems, Cameras

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Proceedings Article | 13 June 2023 Presentation + Paper

Presentation + Paper

SWIFT EI: event-based SWIR sensor for tactical applications

R. Fraenkel, C. Jakobson, N. Ben Ari, R. Dobromislin, N. Shiloah, M. Goldfarb, L. Langof, O. Ofer, R. Elishkov, E. Shunem, M. Labilov, M. Alcheck, E. Almog, M. Nitzani, Y. Karni, T. Markovitz, O. Dicker, B. Milgrom

Proceedings Volume 12534, 1253405 (2023) https://doi.org/10.1117/12.2663026

KEYWORDS: Sensors, Short wave infrared radiation, Readout integrated circuits, Pulsed laser operation, Video, Quantum channels, Video processing, Staring arrays, Pulse signals

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Proceedings Article | 27 May 2022 Presentation + Paper

Presentation + Paper

Event-based SWIR sensor

Claudio Jakobson, Rami Fraenkel, Nimrod Ben Ari, Roman Dobromislin, Niv Shiloah, Tomer Argov, Willie Freiman, Gal Zohar, Lidia Langof, Oren Ofer, Rahel Elishkov, Edan Shunem, Michael Labilov, Menashe Alcheck, Yiftah Kalfa, Michal Nitzani, Yoram Karni, Itay Shtrichman, Tuvy Markovitz

Proceedings Volume 12107, 1210704 (2022) https://doi.org/10.1117/12.2618290

KEYWORDS: Readout integrated circuits, Sensors, Short wave infrared radiation, Imaging systems, Pulsed laser operation, Machine vision, Indium gallium arsenide

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Proceedings Article | 23 May 2018 Presentation + Paper

Presentation + Paper

Spatial and spectral filtering on focal plane arrays

Yoram Karni, Michal Nitzani, Eli Jacobsohn, Ilana Grimberg, Sivan Gliksman, Avihoo Giladi, Leonid Krasovitski, Eran Avnon, Itay Hirsh, Leonid Bikov, Inna Lukomsky, Lior Shkedy, Rami Fraenkel, Itay Shtrichman, Pilar Gonzalez, Andy Lambrechts

Proceedings Volume 10624, 106241H (2018) https://doi.org/10.1117/12.2299302

KEYWORDS: Sensors, Staring arrays, Optical filters, Short wave infrared radiation, Cameras, Imaging systems, Image filtering, Modulation transfer functions, Hyperspectral imaging, High angular resolution imaging, Infrared imaging

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Proceedings Article | 16 May 2017 Paper

Paper

10um pitch family of InSb and XBn detectors for MWIR imaging

G. Gershon, E. Avnon, M. Brumer, W. Freiman, Y. Karni, T. Niderman, O. Ofer, T. Rosenstock, D. Seref, N. Shiloah, L. Shkedy, R. Tessler, I. Shtrichman

Proceedings Volume 10177, 101771I (2017) https://doi.org/10.1117/12.2261703

KEYWORDS: Electro optical sensors, Sensors, Readout integrated circuits, Mid-IR, Infrared detectors, Staring arrays, Electro optics, Imaging systems, Single crystal X-ray diffraction, Telecommunications, Image sensors

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There has been a growing demand over the past few years for infrared detectors with a smaller pixel dimension. On the one hand, this trend of pixel shrinkage enables the overall size of a given Focal Plan Array (FPA) to be reduced, allowing the production of more compact, lower power, and lower cost electro-optical (EO) systems. On the other hand, it enables a higher image resolution for a given FPA area, which is especially suitable in infrared systems with a large format that are used with a wide Field of View (FOV). In response to these market trends SCD has developed the Blackbird family of 10 μm pitch MWIR digital infrared detectors. The Blackbird family is based on three different Read- Out Integrated Circuit (ROIC) formats: 1920×1536, 1280×1024 and 640×512, which exploit advanced and mature 0.18 μm CMOS technology and exhibit high functionality with relatively low power consumption. Two types of 10 μm pixel sensing arrays are supported. The first is an InSb photodiode array based on SCD's mature planar implanted p-n junction technology, which covers the full MWIR band, and is designed to operate at 77K. The second type of sensing array covers the blue part of the MWIR band and uses the patented XBn-InAsSb barrier detector technology that provides electro-optical performance equivalent to planar InSb but at operating temperatures as high as 150 K. The XBn detector is therefore ideal for low Size, Weight and Power (SWaP) applications. Both sensing arrays, InSb and XBn, are Flip-chip bonded to the ROICs and assembled into custom designed Dewars that can withstand harsh environmental conditions while minimizing the detector heat load. A dedicated proximity electronics board provides power supplies and timing to the ROIC and enables communication and video output to the system. Together with a wide range of cryogenic coolers, a high flexibility of housing designs and various modes of operation, the Blackbird family of detectors presents solutions for EO systems which cover both the very high-end and the low SWaP types of application. In this work we present in detail the EO performance of the Blackbird detector family.

Proceedings Article | 24 June 2014 Paper

Paper

Large format 15µm pitch XBn detector

Yoram Karni, Eran Avnon, Michael Ben Ezra, Eyal Berkowitz, Omer Cohen, Yossef Cohen, Roman Dobromislin, Itay Hirsh, Olga Klin, Philip Klipstein, Inna Lukomsky, Michal Nitzani, Igor Pivnik, Omer Rozenberg, Itay Shtrichman, Michael Singer, Shay Sulimani, Avi Tuito, Eliezer Weiss

Proceedings Volume 9070, 90701F (2014) https://doi.org/10.1117/12.2049691

KEYWORDS: Sensors, Staring arrays, Readout integrated circuits, Single crystal X-ray diffraction, Diffusion, Interference (communication), Mid-IR, Image quality, Diodes, Detector development

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Proceedings Article | 4 March 2013 Paper

Paper

Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm

Dan Yanson, Moshe Levy, Moshe Shamay, Shalom Cohen, Lior Shkedy, Yuri Berk, Renana Tessler, Genadi Klumel, Noam Rappaport, Yoram Karni

Proceedings Volume 8640, 86401I (2013) https://doi.org/10.1117/12.2003785

KEYWORDS: Electroluminescence, Laser ablation, Mid-IR, Reliability, Scanning electron microscopy, Mirrors, Laser development, FT-IR spectroscopy, Semiconductor lasers, Spectroscopy

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Proceedings Article | 9 February 2012 Paper

Paper

High-power single emitters for fiber laser pumping across 8xx nm-9xx nm wavelength bands

Moshe Levy, Noam Rappaport, Genadi Klumel, Moshe Shamay, Renana Tessler, Dan Yanson, Shalom Cohen, Yaroslav Don, Yoram Karni

Proceedings Volume 8241, 82410A (2012) https://doi.org/10.1117/12.909016

KEYWORDS: Reliability, Semiconductor lasers, Fiber lasers, Temperature metrology, Near field optics, Data modeling, Resistance, Failure analysis, Multimode fibers

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Proceedings Article | 26 May 2011 Paper

Paper

High-brightness diode pump sources for solid-state and fiber laser pumping across 8xx-9xx nm range

Ronen Diamant, Yuri Berk, Shalom Cohen, Genady Klumel, Moshe Levy, Yaki Openhaim, Ophir Peleg, Dan Yanson, Yoram Karni

Proceedings Volume 8039, 80390E (2011) https://doi.org/10.1117/12.883831

KEYWORDS: Fiber lasers, Packaging, Reliability, Single crystal X-ray diffraction, Head, Semiconductor lasers, Diodes, Solid state lasers, Semiconducting wafers, Laser development

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Proceedings Article | 21 February 2011 Paper

Paper

Facet engineering of high power single emitters

Dan Yanson, Moshe Levi, Moshe Shamay, Renana Tesler, Noam Rappaport, Yaroslav Don, Yoram Karni, Itzhak Schnitzer, Noam Sicron, Sergey Shusterman

Proceedings Volume 7918, 79180Z (2011) https://doi.org/10.1117/12.876261

KEYWORDS: Reliability, Dielectrics, Absorption, Coating, Nonabsorbing mirrors, Mirrors, Semiconductor lasers, Quantum wells, High power lasers, Epitaxy

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Proceedings Article | 21 February 2011 Paper

Paper

Temperature and current accelerated lifetime conditions and testing of laser diodes for ESA BepiColombo space mission

Genady Klumel, Yoram Karni, Shalom Cohen, Markus Rech, Kai Weidlich

Proceedings Volume 7918, 791804 (2011) https://doi.org/10.1117/12.874863

KEYWORDS: Semiconductor lasers, Reliability, Temperature metrology, Space operations, Single crystal X-ray diffraction, Optical inspection, Inspection, Manufacturing, Analytical research, Laser optics

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Proceedings Article | 21 February 2011 Paper

Paper

Scaleable multi-format QCW pump stacks based on 200W laser diode bars and mini bars at 808nm and 940nm

Yuri Berk, Yoram Karni, Genady Klumel, Yaakov Openhaim, Shalom Cohen, Dan Yanson

Proceedings Volume 7918, 79180W (2011) https://doi.org/10.1117/12.876150

KEYWORDS: Packaging, Reliability, Semiconductor lasers, Single crystal X-ray diffraction, Head, Semiconducting wafers, Optical pumping, Laser development, Wafer-level optics, Resistance

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Proceedings Article | 4 May 2010 Paper

Paper

Water-cooled hard-soldered kilowatt laser diode arrays operating at high duty cycle

Genady Klumel, Yoram Karni, Jacob Oppenhaim, Yuri Berk, Moshe Shamay, Renana Tessler, Shalom Cohen, Shlomo Risemberg

Proceedings Volume 7686, 76860K (2010) https://doi.org/10.1117/12.848924

KEYWORDS: Collimation, Semiconductor lasers, Reliability, Optics manufacturing, Laser welding, High power lasers, Manufacturing, Active optics, Temperature metrology, Defense and security

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Proceedings Article | 18 February 2010 Paper

Paper

Development of asymmetric epitaxial structures for 65% efficiency laser diodes in the 9xx-nm range

Moshe Levy, Yoram Karni, Noam Rapaport, Yaroslav Don, Yuri Berk, Dan Yanson, Shalom Cohen, Jacob Oppenheim

Proceedings Volume 7583, 75830J (2010) https://doi.org/10.1117/12.843661

KEYWORDS: Waveguides, Doping, Semiconductor lasers, Wafer-level optics, Cladding, Resistance, Semiconducting wafers, Laser development, High power lasers, Fiber couplers

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Proceedings Article | 18 February 2010 Paper

Paper

High duty cycle hard soldered kilowatt laser diode arrays

Genady Klumel, Yoram Karni, Jacob Oppenheim, Yuri Berk, Moshe Shamay, Renana Tessler, Shalom Cohen

Proceedings Volume 7583, 75830C (2010) https://doi.org/10.1117/12.843660

KEYWORDS: Collimation, Semiconductor lasers, Reliability, High power lasers, Manufacturing, Active optics, Laser development, Optics manufacturing, Packaging, Optical alignment

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Proceedings Article | 9 May 2009 Paper

Paper

High-power laser diodes at SCD: performance and reliability for defence and space applications

Shlomo Risemberg, Yoram Karni, Genadi Klumel, Moshe Levy, Yuri Berk, Markus Rech, Hubert Becht, Bruno Frei

Proceedings Volume 7325, 73250U (2009) https://doi.org/10.1117/12.817729

KEYWORDS: Single crystal X-ray diffraction, Reliability, Semiconductor lasers, Diodes, Packaging, Manufacturing, Semiconducting wafers, High power lasers, Head, Defense and security

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Proceedings Article | 24 February 2009 Paper

Paper

Space-grade reliability of 808nm QCW laser diode arrays (LDAs) delivering over 20 billion shots

Yuri Berk, Yoram Karni, Genadi Klumel, Moshe Levy, Yaki Openhaim, Shlomo Risemberg, Markus Rech, Hubert Becht, Bruno Frei, Fabrice Monti di Sopra

Proceedings Volume 7198, 71980C (2009) https://doi.org/10.1117/12.808828

KEYWORDS: Single crystal X-ray diffraction, Semiconductor lasers, Reliability, Manufacturing, Semiconducting wafers, Packaging, Laser welding, Collimation, Planets, Optics manufacturing

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Proceedings Article | 25 February 2008 Paper

Paper

Active cooling solutions for high power laser diodes stacks

Yoram Karni, Genady Klumel, Moshe Levy, Yuri Berk, Yaki Openhaim, Yaakov Gridish, Asher Elgali, Meir Avisar, Moshe Blonder, Hila Sagy, Alex Gertsenshtein

Proceedings Volume 6876, 687604 (2008) https://doi.org/10.1117/12.765156

KEYWORDS: Semiconductor lasers, High power lasers, Copper, Diodes, Reliability, Resistance, Corrosion, Laser packaging, Ions

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Proceedings Article | 7 February 2007 Paper

Paper

Highly efficient and reliable 1 kW QCW laser stacks with diffraction limited fast axis beam collimation

Nir Feldman, Yoram Karni, Yuri Berk, Yaakov Gridish, Genadi Klumel, Moshe Levy, Shlomo Risemberg

Proceedings Volume 6456, 64561C (2007) https://doi.org/10.1117/12.700301

KEYWORDS: Collimation, Semiconductor lasers, Lenses, Laser development, High power lasers, Diffraction, Electro optics, Manufacturing, Reliability, Humidity

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Proceedings Article | 15 February 2006 Paper

Paper

Effect of compressive and tensile strain on the performance of 808-nm QW high power laser diodes

Moshe Levy, Yuri Berk, Yoram Karni

Proceedings Volume 6104, 61040B (2006) https://doi.org/10.1117/12.645815

KEYWORDS: Quantum wells, Polarization, Transparency, High power lasers, Semiconductor lasers, Continuous wave operation, Optical matrix switches, Optical components, Diodes

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Proceedings Article | 15 February 2006 Paper

Paper

Reliable high power diode lasers: thermo-mechanical fatigue aspects

Genady Klumel, Yaakov Gridish, Igor Szafranek, Yoram Karni

Proceedings Volume 6104, 610402 (2006) https://doi.org/10.1117/12.644435

KEYWORDS: Pulsed laser operation, Continuous wave operation, Reliability, Laser welding, Failure analysis, Laser bonding, Copper, Gallium arsenide, Semiconductor lasers, Indium

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Showing 5 of 21 publications

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