Mr. Weiwei Wu Profile

Weiwei Wu

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 3 December 2014 Paper

Nonlinearity properties of a phthalocyanine film researching by top-hat Z-scan techniques

Wei-wei Wu, Jun-yi Yang, Ying-lin Song

Proceedings Volume 9297, 92971O (2014) https://doi.org/10.1117/12.2073039

KEYWORDS: Refraction, Thin films, Picosecond phenomena, Nonlinear optics, Transmittance, Phase shifts, Sensors, Gaussian beams, Radio propagation, Numerical simulations

Read Abstract +

The third-order nonlinear refractive response in a kind of thin phthalocyanine film has been investigated using two types of top-hat Z-scan techniques with a picoseconds pulses laser at wavelength of 532nm. The nonlinear phase shift of this sample is so week because of the very small thickness of the films, and the normal top-hat Z-scan technique is often difficult to measure the results. To research the nonlinear response of this thin film, we also has been measured it using the modified top-hat Z-scan technique under the experimental conditions of the same. The curve of the modified top-hat Z-scan for the nonlinear refraction is only a single peak and the result shows this kind of film has obvious response of nonlinear refraction with 19 picoseconds pulses. Furthermore, we have been carried on the theoretical analysis and the numerical simulation with the result of the experiment, and the theoretical simulation fit well with experimental results, the value of the nonlinear refraction index is obtained to be n₂ = 6.25×10⁻¹⁵ m² /W . By comparing the measured curve of the two, the results indicate that the sensitivity of the modified top-hat Z-scan measurement is greatly enhanced.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years