Paper
23 September 1996 Invar electrodeposition for MEMS application
Toshiki Hirano, Long-Sheng Fan
Author Affiliations +
Proceedings Volume 2879, Micromachining and Microfabrication Process Technology II; (1996) https://doi.org/10.1117/12.251214
Event: Micromachining and Microfabrication '96, 1996, Austin, TX, United States
Abstract
Low thermal expansion metal such as Invar is suitable for MEMS application, where the dimension stability requirement is very high over a wide temperature range. Invar electrodeposition process was developed as a method to fabricate Invar structure. The effect of plating parameters were investigated to develop optimized Invar deposition process. The Invar film obtained in this research has the thermal coefficient of expansion as low as 6.3 PPM/K, which is almost half of that of pure nickel. The process compatibility to the rest of MEMS fabrication process was proved through the prototyping of a microstructure.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toshiki Hirano and Long-Sheng Fan "Invar electrodeposition for MEMS application", Proc. SPIE 2879, Micromachining and Microfabrication Process Technology II, (23 September 1996); https://doi.org/10.1117/12.251214
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Cited by 20 scholarly publications.
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KEYWORDS
Plating

Nickel

Microelectromechanical systems

Iron

Temperature metrology

Ions

Electrodes

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