Paper
22 August 2000 Miniature high-resolution imaging system with 3D MOEMS beam scanning for Mars exploration
David L. Dickensheets, Phillip A. Himmer, Robert A. Friholm, B. Jeffrey Lutzenberger
Author Affiliations +
Proceedings Volume 4178, MOEMS and Miniaturized Systems; (2000) https://doi.org/10.1117/12.396518
Event: Micromachining and Microfabrication, 2000, Santa Clara, CA, United States
Abstract
A compact confocal imaging instrument is described that makes use of a high-performance bi-axial Silicon torsion mirror, in concert with a reflective dynamic parabolic membrane mirror to provide 3D beam scanning. This beam scan engine is incorporated into a confocal imaging Raman spectrometer under development for exploration of Martian rocks and soil, designed to achieve optical resolution of 1 micrometers at (lambda) equals 850 nm, with a field of view of 300 micrometers and focus control of more than 200 micrometers . Fast x-y beam scanning is achieved with the bi-axial scanner, while the parabolic membrane provides both static and dynamic focus control for gross instrument focus as well as on-the fly field curvature correction or substrate contour tracing. In this paper we describe the MOEM elements as well as on-the-fly curvature correction or substrate contour tracing. In this paper we describe the MOEM elements as well as the overall instrument architecture. We also present initial imaging results using the torsion mirror scanner, and we describe the dynamic focus element fabrication, modeling and preliminary experimental characterization.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Dickensheets, Phillip A. Himmer, Robert A. Friholm, and B. Jeffrey Lutzenberger "Miniature high-resolution imaging system with 3D MOEMS beam scanning for Mars exploration", Proc. SPIE 4178, MOEMS and Miniaturized Systems, (22 August 2000); https://doi.org/10.1117/12.396518
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Cited by 8 scholarly publications.
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KEYWORDS
Mirrors

Silicon

Etching

Microopto electromechanical systems

Confocal microscopy

Mars

Raman spectroscopy

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