Paper
25 March 2010 Meso-scale simulation of the line-edge structure based on polymer chains in the developing and rinse process
Hiroshi Morita, Masao Doi
Author Affiliations +
Abstract
To study the line edge roughness, we developed the simulation method of formation process of line edge based on the meso-scale simulation of dissipative particle dynamics (DPD) method. We modeled the development and rinse processes based on the coarse-grained polymer model. It is important that the block copolymer in which the soluble and insoluble blocks are bonded exists at the line edge. Though the soluble part of this block copolymer is stretched out in the developing process, it becomes shrunk in the rinse process. The shrunk polymers contribute to the formation of line edge, and LER was much influenced by these polymers. These simulations will represent the formation process of line edge based on the polymer chain dynamics.
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Hiroshi Morita and Masao Doi "Meso-scale simulation of the line-edge structure based on polymer chains in the developing and rinse process", Proc. SPIE 7639, Advances in Resist Materials and Processing Technology XXVII, 763932 (25 March 2010); https://doi.org/10.1117/12.846526
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Cited by 3 scholarly publications.
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KEYWORDS
Polymers

Particles

Liquids

Line edge roughness

Edge roughness

Interfaces

Polymer thin films

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