A fabrication of the surface-enhanced Raman scattering (SERS) active substrates has been developed by immersion
plating of the silver onto porous silicon (Ag-por-Si). Effects of the porous silicon morphology on the structure of the Ag
films have been analyzed by scanning electronic microscope. Activity of the Ag-coated por-Si toward SERS was
estimated using water-soluble porphyrins as analyte molecules. The Ag-por-Si samples were appeared to be sensitive
and stable SERS-active substrates. It has been found that the variation of SERS signal scanned over the sample surface is
less than 9%. Additionally, plates of Ag-por-Si displayed high sensitivity being stored within 1 month in the air. It was
shown that even several minutes incubation of Ag-por-Si in solution is enough to obtain well-defined SERS signal.
SERS spectra of the water-soluble cationic tetrakis(N-methylpyridyl)porphyrin (H2TMPyP4) and anionic
tetrakis(sulfonatophenyl)porphyrin (H2TPPS) were compared with their resonance Raman (RR) spectra. For the cationic
H2TMPyP4 the partial metallation has been detected during impregnation of the porphyrin molecules on the Ag-por-Si
surface. In case of the anionic H2TPPS there was no evidence of the silver complex formation.
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