Jiwan Han
at Siemens EDA
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2018 Presentation + Paper
Sergey Kobelkov, Victoria Roizen, Sergei Rodin, Alexander Tritchkov, JiWan Han, Yuri Granik
Proceedings Volume 10587, 105870I (2018) https://doi.org/10.1117/12.2297262
KEYWORDS: Photomasks, Lithography, Source mask optimization, Optical lithography

Proceedings Article | 24 March 2016 Paper
Sergey Kobelkov, Alexander Tritchkov, JiWan Han
Proceedings Volume 9778, 97782X (2016) https://doi.org/10.1117/12.2219281
KEYWORDS: Lithography, Photomasks, Computational lithography, Critical dimension metrology, Defect detection, Optical proximity correction, Photovoltaics, Optical lithography, Visualization, Distance measurement, Bromine, Ions

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