Patrick Rehain
at Stevens Institute of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 March 2023 Presentation + Paper
Daniel Tafone, Luke McEvoy, Yong Meng Sua, Patrick Rehain, Yuping Huang
Proceedings Volume 12447, 1244708 (2023) https://doi.org/10.1117/12.2652945
KEYWORDS: Surface roughness, Matrices, Photons, LIDAR, Education and training, Pulse signals, Histograms, Metals, Imaging systems, Upconversion

Proceedings Article | 22 April 2020 Presentation + Paper
Proceedings Volume 11420, 1142009 (2020) https://doi.org/10.1117/12.2560535
KEYWORDS: Photons, Signal to noise ratio, Signal detection, Imaging systems, Scattering, Stereoscopy, Image resolution, 3D image processing, Absorption, Signal attenuation

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