Paper
16 February 2022 Research on thermal stress and trapping level of green mini LED
Yuxuan Wang, Shengrui Xu, Bingji Li, Chenyan Cheng, Xiao Wang, Xuhao Yang, Qiong Wang, Juanxiong Chang, Cai Chen, Yuyan Shao, Yong Huang
Author Affiliations +
Proceedings Volume 12164, International Conference on Optoelectronic Materials and Devices (ICOMD 2021); 121641I (2022) https://doi.org/10.1117/12.2628550
Event: 2021 International Conference on Optoelectronic Materials and Devices, 2021, Guangzhou, China
Abstract
The same batch of green LEDs were subjected to thermal stress aging for different periods of time. The I-V characteristic test result shows that the current of the aging device under the same bias voltage increases, and the increase is positively correlated with the aging time. Observing the light-emitting condition of the device under the CCD lens, it is found that the long-term aging leads to the deterioration of the light-emitting characteristics of the device. The current transport mechanism is analyzed based on the test results of I-V characteristics and optical characteristics. Finally, the influence of the trap on the luminous characteristics of the green LED was verified by the Silvaco TCAD simulation tool.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuxuan Wang, Shengrui Xu, Bingji Li, Chenyan Cheng, Xiao Wang, Xuhao Yang, Qiong Wang, Juanxiong Chang, Cai Chen, Yuyan Shao, and Yong Huang "Research on thermal stress and trapping level of green mini LED", Proc. SPIE 12164, International Conference on Optoelectronic Materials and Devices (ICOMD 2021), 121641I (16 February 2022); https://doi.org/10.1117/12.2628550
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KEYWORDS
Light emitting diodes

Magnesium

Quantum wells

Green light emitting diodes

Sapphire

TCAD

Gallium nitride

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