The same batch of green LEDs were subjected to thermal stress aging for different periods of time. The I-V characteristic test result shows that the current of the aging device under the same bias voltage increases, and the increase is positively correlated with the aging time. Observing the light-emitting condition of the device under the CCD lens, it is found that the long-term aging leads to the deterioration of the light-emitting characteristics of the device. The current transport mechanism is analyzed based on the test results of I-V characteristics and optical characteristics. Finally, the influence of the trap on the luminous characteristics of the green LED was verified by the Silvaco TCAD simulation tool.
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