Micro-Raman characterization of SiC polytype natural heterostructures

Victor V. Artamonov; Alexei V. Pogorelov; Marion Renucci; Mikhail Ya. Valakh

doi:10.1117/12.225295

23 October 1995 Micro-Raman characterization of SiC polytype natural heterostructures

Victor V. Artamonov, Alexei V. Pogorelov, Marion Renucci, Mikhail Ya. Valakh

Proceedings Volume 2543, Silicon Carbide Materials for Optics and Precision Structures; (1995) https://doi.org/10.1117/12.225295
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

MicroRaman, Raman, photoluminescence and x-ray diffraction spectra were measured for different SiC splices. It has been shown that Raman and especially MicroRaman scattering gives us a gain over other diagnostic techniques on the way to define polytype structure of the splice.

Citation Download Citation

Victor V. Artamonov, Alexei V. Pogorelov, Marion Renucci, and Mikhail Ya. Valakh "Micro-Raman characterization of SiC polytype natural heterostructures", Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); https://doi.org/10.1117/12.225295

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