Dr. Alvarado Tarun Profile

Dr. Alvarado Tarun

Research Scientist at RIKEN

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 28 August 2008 Paper

Highly efficient heating assisted tip-enhanced Raman spectroscopy

Alvarado Tarun, Norihiko Hayazawa, Masashi Motohashi, Satoshi Kawata

Proceedings Volume 7033, 70330C (2008) https://doi.org/10.1117/12.793999

KEYWORDS: Raman spectroscopy, Silicon, Signal detection, Optical filters, Raman scattering, Transmittance, Polarizers, Polarization, Electronic filtering, Silver

Read Abstract +

We present a tip-enhanced Raman spectroscopy (TERS) system that permits efficient illumination and detection of optical properties in the visible range to obtain high contrasts Raman signals from strained silicon (ε-Si) assembled on silicon germanium substrate using an edge filter. The cut-off investigation in a depolarized TERS configuration. We overshadow wavelength of the edge filter is tuned by changing the angle of incident beam to deliver high incident power and effectively collect scattered near-field signals for nanoscopic strong far-field background signals from Raman active materials by utilizing the results obtained from depolarized surface-enhanced Raman scattering experiments in conjunction with silicon Raman tensor calculation to quantify which polarizer, analyzer and sample azimuth combination gives the minimum far-field signals. Here, we utilize the s-polarization instead of p-polarized light in conjunction with polarization properties of ε-Si to obtain a high contrast Raman signal. We found that for imaging Raman active and bulk crystalline materials such as silicon, background signal suppression (s-illumination) is more important than the field enhancement with strong far-field signal levels (p-polarization). The utilization of an edge filter for shorter collection time, depolarized configuration for higher contrast and tip heating for higher resolution are discussed.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years