Dr. Ben Dryer Profile

Dr. Ben Dryer

Post-Doctoral Researcher at Open Univ

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Author

Publications (22)

Proceedings Article | 23 August 2024 Presentation + Paper

Tracking radiation damage of Euclid VIS detectors after one year in space

Jesper Skottfelt, Matt Wander, Mark Cropper, Ben Dryer, David Hall, Richard Hayes, Bradley Kelman, Tom Kitching, Ralf Kohley, David Lagattuta, Zoe Lee-Payne, Patricia Liebing, Richard Massey, Henry Joy McCracken, Reiko Nakajima, James Nightingale

Proceedings Volume 13092, 130920P (2024) https://doi.org/10.1117/12.3017996

KEYWORDS: Silicon, Charge-coupled devices, Sensors, Calibration, Manufacturing, Space operations, Semiconducting wafers

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Proceedings Article | 21 August 2024 Poster + Paper

Evaluating UV detector enhancement technologies for the next generation of space telescopes: the path to CASTOR

Jesper Skottfelt, Chiaki Crews, Ben Dryer, David Hall, Oliver Hetherington, Michael W. Hubbard, Douglas Jordan, David Morris

Proceedings Volume 13093, 130933W (2024) https://doi.org/10.1117/12.3018390

KEYWORDS: Ultraviolet radiation, Ultraviolet detectors, Sensors, Space telescopes, Imaging spectroscopy, Quantum efficiency, CMOS sensors, Stars, Silicon

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Proceedings Article | 29 August 2022 Presentation + Paper

Calibrating and correcting charge transfer inefficiency in CCDs using Pyxel

Bradley Kelman, Thibaut Prod'homme, Jesper Skottfelt, Frédéric Lemmel, Matej Arko, Patricia Liebing, Peter Verhoeve, Ben Dryer, David Hall, Michael Hubbard

Proceedings Volume 12191, 121911F (2022) https://doi.org/10.1117/12.2629896

KEYWORDS: Calibration, Charge-coupled devices, Data modeling, Electrons, Sensors, Galactic astronomy, Computer simulations, Data corrections, Solid modeling, Image sensors

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Proceedings Article | 29 August 2022 Presentation + Paper

Modelling charge transfer inefficiency in Gaia CCDs with in-flight and on-ground data

Saad Ahmed, David Hall, Jesper Skottfelt, Ben Dryer, Andrew Holland, Cian Crowley, Jose Hernandez

Proceedings Volume 12191, 121911G (2022) https://doi.org/10.1117/12.2629273

KEYWORDS: Charge-coupled devices, Data modeling, Calibration, Space operations, Monte Carlo methods, Modeling, Silicon, Sensors, Instrument modeling

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Proceedings Article | 29 August 2022 Presentation

Comparison of trap pumping and EPER data

Jesper Skottfelt, Zoe Lee-Payne, David Hall, Ben Dryer

Proceedings Volume 12191, 121910A (2022) https://doi.org/10.1117/12.2627483

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SPIE Journal Paper | 1 February 2022 Open Access

Understanding the evolution of radiation damage on the Gaia CCDs after 72 months at L2

Saad Ahmed, David Hall, Cian Crowley, Jesper Skottfelt, Ben Dryer, George Seabroke, José Hernández, Andrew Holland

JATIS, Vol. 8, Issue 01, 016003, (February 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.1.016003

KEYWORDS: Charge-coupled devices, Manufacturing, Measurement devices, Calibration, Space operations, Electrons, Solar energy, Solar processes, Particles, Silicon

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Proceedings Article | 13 December 2020 Presentation + Paper

Gaia CCDs: charge transfer inefficiency measurements between five years of flight

Saad Ahmed, David Hall, Cian Crowley, Jesper Skottfelt, Ben Dryer, George Seabroke, Jose Hernandez, Andrew Holland

Proceedings Volume 11454, 114540S (2020) https://doi.org/10.1117/12.2562162

KEYWORDS: Charge-coupled devices, Space operations, Observatories, Signal attenuation

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Proceedings Article | 13 December 2020 Poster

12 months of cold operations, a first look at CCD273 post-irradiation

Zoe Lee-Payne, Jesper Skottfelt, Ben Dryer, David Hall, Andrew Holland

Proceedings Volume 11454, 114541X (2020) https://doi.org/10.1117/12.2562340

KEYWORDS: Charge-coupled devices, Galactic astronomy, Sensors, Cryogenics, X-ray detectors, X-ray imaging, X-rays, Annealing

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Proceedings Article | 9 September 2019 Paper

The silicon lattice defects in proton and gamma irradiated n-channel CCDs

Anton Lindley-DeCaire, D. Hall, N. Bush, B. Dryer, A. Holland

Proceedings Volume 11115, 111150C (2019) https://doi.org/10.1117/12.2530639

KEYWORDS: Charge-coupled devices, Silicon, Sensors, Gamma radiation, Space operations, Particles, Image processing

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Proceedings Article | 20 July 2018 Presentation + Paper

C3TM: CEI CCD charge transfer model for radiation damage analysis and testing

Jesper Skottfelt, David Hall, Ben Dryer, Ross Burgon, Andrew Holland

Proceedings Volume 10709, 1070918 (2018) https://doi.org/10.1117/12.2309944

KEYWORDS: Charge-coupled devices, Monte Carlo methods, Electrons, Radiation effects, Electrodes, Silicon, 3D modeling, Instrument modeling, Analytical research, Signal processing

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Proceedings Article | 10 July 2018 Presentation

A comparison of proton damage effects on P- and N-Channel CCDs I: performance following cryogenic irradiation (Conference Presentation)

Nathan Bush, Ben Dryer, Anton Lindley De-Caire, Ross Burgon, Andrew Holland

Proceedings Volume 10709, 107090M (2018) https://doi.org/10.1117/12.2313447

KEYWORDS: Charge-coupled devices, Cryogenics, Silicon, Tolerancing, Manufacturing, Space operations

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SPIE Journal Paper | 28 March 2018

Importance of charge capture in interphase regions during readout of charge-coupled devices

Jesper Skottfelt, David Hall, Ben Dryer, Nathan Bush, Jason P. D. Gow, Andrew Holland

JATIS, Vol. 4, Issue 01, 018005, (March 2018) https://doi.org/10.1117/12.10.1117/1.JATIS.4.1.018005

KEYWORDS: Charge-coupled devices, Probability theory, Sensors, Calibration, Electronic imaging, Monte Carlo methods, Silicon, Radiation effects, Electrodes, Data analysis

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Proceedings Article | 19 October 2016 Paper

Validation of NIEL for >1MeV electrons in silicon using the CCD47-20

B. Dryer, P. Smith, T. Nuns, N. Murray, K. Stefanov, J. P. D. Gow, R. Burgon, D. Hall, A. Holland

Proceedings Volume 9915, 991531 (2016) https://doi.org/10.1117/12.2233975

KEYWORDS: Photodiodes, Instrument modeling, Radiation effects, Optical sensors, Electrons, Silicon, Charge-coupled devices, Data modeling, Particles, CCD image sensors

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Proceedings Article | 1 August 2016 Paper

Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing

J. P. Gow, N. Murray, D. Wood, D. Burt, D. Hall, B. Dryer, A. Holland

Proceedings Volume 9915, 99150L (2016) https://doi.org/10.1117/12.2232684

KEYWORDS: Space operations, Charge-coupled devices, Cryogenics, Annealing, Temperature metrology, X-rays, Silicon, X-ray imaging, Carbon, Astatine

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SPIE Journal Paper | 9 June 2016

Postirradiation behavior of p-channel charge-coupled devices irradiated at 153 K

Jason P. Gow, Daniel Wood, Neil Murray, David Burt, David Hall, Ben Dryer, Andrew Holland

JATIS, Vol. 2, Issue 02, 026001, (June 2016) https://doi.org/10.1117/12.10.1117/1.JATIS.2.2.026001

KEYWORDS: Charge-coupled devices, Cryogenics, Silicon, Carbon, Sensors, Clocks, Temperature metrology, X-rays, Light emitting diodes, Atrial fibrillation

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Proceedings Article | 22 September 2015 Paper

A global shutter CMOS image sensor for hyperspectral imaging

Konstantin Stefanov, Ben Dryer, David Hall, Andrew Holland, Jérôme Pratlong, Martin Fryer, Andrew Pike

Proceedings Volume 9602, 96020K (2015) https://doi.org/10.1117/12.2187856

KEYWORDS: Camera shutters, Sensors, Hyperspectral imaging, Capacitors, Image sensors, Interference (communication), Transistors, Diffusion, CMOS sensors, Cadmium sulfide

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Proceedings Article | 24 August 2015 Paper

Initial results from a cryogenic proton irradiation of a p-channel CCD

J. P. Gow, D. Wood, D. Burt, D. Hall, B. Dryer, A. Holland, N. Murray

Proceedings Volume 9601, 96010F (2015) https://doi.org/10.1117/12.2188284

KEYWORDS: Charge-coupled devices, Cryogenics, Carbon, Sensors, X-rays, Silicon, Aluminum, Particles, Clocks, CCD image sensors

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Proceedings Article | 23 July 2014 Paper

Assessment of the performance and radiation damage effects under cryogenic temperatures of a P-channel CCD204s

Neil Murray, Andrew Holland, Jason P. D. Gow, David Hall, Konstantin Stefanov, Ben Dryer, Simeon Barber, David Burt

Proceedings Volume 9154, 91540P (2014) https://doi.org/10.1117/12.2069289

KEYWORDS: Clocks, Charge-coupled devices, Radiation effects, Cryogenics, Temperature metrology, Cameras, Manufacturing, Electro optics, X-rays, Annealing

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Proceedings Article | 26 September 2013 Paper

Multi-level parallel clocking of CCDs for: improving charge transfer efficiency, clearing persistence, clocked anti-blooming, and generating low-noise backgrounds for pumping

Neil Murray, David Burt, Andrew Holland, Konstantin Stefanov, Jason P. Gow, Calum MacCormick, Ben Dryer, Edgar A. Allanwood

Proceedings Volume 8860, 88600K (2013) https://doi.org/10.1117/12.2024839

KEYWORDS: Clocks, Charge-coupled devices, Electrodes, Electroluminescence, Ions, Neodymium, Sensors, Signal detection, Astronomy, X-rays

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Proceedings Article | 25 September 2012 Paper

X-ray performance of e2v’s 0.18 µm CMOS APS test arrays for solar observation

B. Dryer, A. Holland, P. Jerram, Taro Sakao

Proceedings Volume 8453, 84532J (2012) https://doi.org/10.1117/12.926197

KEYWORDS: X-rays, Sensors, X-ray imaging, CMOS sensors, CMOS technology, Spectroscopy, Imaging systems, Back illuminated sensors, Modulation transfer functions, Manganese

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Proceedings Article | 27 September 2011 Paper

Compact CMOS Camera Demonstrator (C3D) for Ukube-1

R. Harriss, A. Holland, S. Barber, S. Karout, R. Burgon, B. Dryer, N. Murray, D. Hall, P. Smith, T. Grieg, J. Tutt, J. Endicott, P. Jerram, D. Morris, M. Robbins, V. Prevost, K. Holland

Proceedings Volume 8146, 81460U (2011) https://doi.org/10.1117/12.895986

KEYWORDS: Sensors, Imaging systems, Control systems, Copper indium disulfide, Radiation effects, Field programmable gate arrays, Aerospace engineering, Optical sensors, Image quality, Image resolution

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Proceedings Article | 20 July 2010 Paper

Gamma radiation damage study of 0.18 µm process CMOS image sensors

Ben Dryer, Andrew Holland, N. Murray, Paul Jerram, Mark Robbins, David Burt

Proceedings Volume 7742, 77420E (2010) https://doi.org/10.1117/12.863948

KEYWORDS: Gamma radiation, Image processing, CMOS sensors, Sensors, Radiation effects, CMOS technology, Photonic integrated circuits, Charge-coupled devices, Machine vision, Imaging systems

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Showing 5 of 22 publications

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