Quantum dot lasers directly grown on silicon are excellent candidates to achieve energy and cost-efficient optical transceivers thanks to their outstanding properties such as high temperature stability, low threshold lasing operation, and high feedback tolerance. In order to reach even better performance, p-type doping is used to eliminate gain saturation, gain broadening due to hole thermalization and to further reduce the linewidth enhancement factor. Optical transceivers with low relative intensity noise are also highly desired to carry broadband data with low bit-error rate. Indeed, the intensity noise stemming from intrinsic optical phase and frequency fluctuations caused by spontaneous emission and carrier noise degrades the signal-to-noise ratio and the bit-error rate hence setting a limit of a highspeed communication system. This paper constitutes a comprehensive study of the intensity noise properties of epitaxial quantum dot lasers on silicon. Results show minimal values between - 140 dB/Hz and - 150 dB/Hz for doping level between 0 and 20 holes/dot in the active region. In particular, the intensity noise is insensitive to temperature for p-doped QD laser. Modulation properties such as damping, carrier lifetime, and K-factor are also extracted from the noise characteristics and analyzed with respect to the doping level. We also provide numerical insights based on an excitonic model illustrating the effects of the Shockley-Read-Hall recombination on the intensity noise features. These new findings are meaningful for designing high speed and low noise quantum dot devices to be integrated in future photonic integrated circuits.
Photonics integrated circuits on silicon are considered as a key technology for data centers and high-performance computers. Owing to the ultimate carrier confinement and reduced sensitivity to crystalline defects, semiconductor quantum dot lasers directly grown on silicon exhibit remarkable properties such as low threshold current, high temperature stability and robust tolerance to external reflections. This latter property is particularly important for achieving large-scale integrated circuits whereby unintentional back-reflections produced by the various passive/active optoelectronic components can hinder the stability of the lasers. In this context, it is known that quantum dot lasers are more resistant to optical feedback than quantum well ones thanks to the low linewidth enhancement factor, the large damping, and the possible absence of upper lasing states. In this work, we theoretically investigate the reflection sensitivity of quantum dot lasers directly grown on silicon by studying the peculiar role of the epitaxial defects, which induce nonradiative recombination through the Shockley-Read-Hall process. By using the Lang and Kobayashi model, we analyze the nonlinear properties of such quantum dot lasers through the bifurcation diagrams and with respect to the nonradiative lifetime. In particular, we show that the increase of the Shockley-Read-Hall recombination shrinks the chaotic region and shifts the first Hopf bifurcation to higher feedback values. We believe that these results can be useful for designing novel feedback resistant lasers for future photonics integrated circuits operating without optical isolator.
This work reports on the optical feedback dynamics of InAs/GaAs QD lasers epitaxially grown on silicon operating in both the short and long delay regimes. Both undoped and p-doped QD lasers are considered. Whatever the external cavity length, no chaotic oscillations are observed on both samples as a result of the small α-factor observed in the silicon QD lasers. Despite that, experiments conducted in the short-cavity region raise period-one oscillation for the undoped QD laser. In addition, the transition from the short to long delay regimes can be finely covered by varying the external cavity length from 5 cm to 50 cm, and the boundaries associated to the appearance of the periodic oscillation are identified. In the short-cavity region, boundaries show some residual undulations resulting from interferences between internal and external cavity modes; whereas in the long-delay regime, the feedback ratio delimiting the boundaries keeps decreasing, until it progressively becomes rather in- dependent of the external cavity length. Overall, our results showed that the p-doped device clearly exhibits a much higher tolerance to the different external feedback conditions than the undoped one, seeing that its periodic oscillation boundaries are barely impossible to retrieve at the maximum feedback strength of -7 dB. These results show for the first time the p-modulation doping effect on the enhancement of feedback insensitivity in both short- and long-delay configurations, which is of paramount importance for the development of ultra-stable silicon transmitters for photonic technologies.
In this paper we review our recent progress on high performance mode locked InAs quantum dot lasers that are directly grown on CMOS compatible silicon substrates by solid-source molecular beam epitaxy. Different mode locking configurations are designed and fabricated. The lasers operate within the O-band wavelength range, showing pulsewidth down to 490 fs, RF linewidth down to 400 Hz, and pulse-to-pulse timing jitter down to 6 fs. When the laser is used as a comb source for wavelength division multiplexing transmission systems, 4.1 terabit per second transmission capacity was achieved. Self-mode locking is also investigated both experimentally and theoretically. The demonstrated performance makes those lasers promising light source candidates for future large-scale silicon electronic and photonic integrated circuits (EPICs) with multiple functionalities.
The integration of optical functions on a microelectronic chip brings many innovative perspectives, along with the possibility to enhance the performances of photonic integrated circuits (PIC). Owing to the delta-like density of states, quantum dot lasers (QD) directly grown on silicon are very promising for achieving low-cost transmitters with high thermal stability and large insensitivity to optical reflections. This paper investigates the dynamical and nonlinear properties of silicon based QD lasers through the prism of the linewidth broadening factor (i.e. the so-called α-factor) and the optical feedback dynamics. Results demonstrate that InAs/GaAs p-doped QD lasers epitaxially grown on silicon exhibit very low α-factors, which directly transform into an ultra-large resistance against optical feedback. As opposed to what is observed in heterogeneously integrated quantum well (QW) lasers, no chaotic state occurs owing to the high level of QD size uniformity resulting in a near zero α-factor. Considering these results, this study suggests that QD lasers made with direct epitaxial growth is a powerful solution for integration into silicon CMOS technology, which requires both high thermal stability and feedback resistant lasers.
A common way of extracting the chirp parameter (i.e., the α-factor) of semiconductor lasers is usually performed by extracting the net modal gain and the wavelength from the amplified spontaneous emission (ASE) spectrum. Although this method is straightforward, it remains sensitive to the thermal effects hence leading to a clear underestimation of the α-factor. In this work, we investigate the chirp parameter of InAs/GaAs quantum dot (QD) lasers epitaxially grown on silicon with a measurement technique evaluating the gain and wavelength changes of the suppressed side modes by optical injection locking. Given that the method is thermally insensitive, the presented results confirm our initial measurements conducted with the ASE i.e. the α-factor of the QD lasers directly grown on silicon is as low as 0.15 hence resulting from the low threading dislocation density and high material gain of the active region. These conclusions make such lasers very promising for future integrated photonics where narrow linewidth, feedback resistant and low-chirp on-chip transmitters are required.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.