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Chanchal Chanchal
at Indian Institute of Technology Kanpur
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Publications (1)
Proceedings Article | 13 June 2017 Paper
Defect detection of electronic circuit using digital holographic interferometry
. Chanchal, P. Panigrahi
Proceedings Volume 10449, 1044935 (2017) https://doi.org/10.1117/12.2270971
KEYWORDS: Electronic circuits, Digital holography, Holographic interferometry, Defect detection, Digital electronics, Holograms, Defect inspection, Inspection, Phase measurement, 3D displays
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