Dr. Doo-Hyun Cho
at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11611, 116110H (2021) https://doi.org/10.1117/12.2584200
KEYWORDS: RGB color model, Semiconducting wafers, Data modeling, Optical sensors, Optical testing, Hyperspectral imaging, Sensor fusion, Principal component analysis, Metrology, Instrument modeling

Proceedings Article | 21 August 2020 Presentation + Paper
Proceedings Volume 11500, 115000K (2020) https://doi.org/10.1117/12.2566426
KEYWORDS: Data modeling, Semiconducting wafers, Metrology, Image processing, General packet radio service, Visual process modeling, Sensors, Chemical mechanical planarization, RGB color model

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